ISPPAC-CLK5510V-01T48C Lattice, ISPPAC-CLK5510V-01T48C Datasheet - Page 40

Clock Drivers & Distribution PROGRAMMABLE CLOCK GENERATOR

ISPPAC-CLK5510V-01T48C

Manufacturer Part Number
ISPPAC-CLK5510V-01T48C
Description
Clock Drivers & Distribution PROGRAMMABLE CLOCK GENERATOR
Manufacturer
Lattice
Datasheet

Specifications of ISPPAC-CLK5510V-01T48C

Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Maximum Operating Temperature
70 C
Package / Case
TQFP-100
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ISPPAC-CLK5510V-01T48C
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Lattice Semiconductor
ispClock5500 Family Data Sheet
2
VERIFY – This instruction loads data from the E
CMOS array into the column register. The data may then be
shifted out. The device must already be in programming mode for this instruction to execute.
2
VERIFY_INCR – This instruction copies the E
CMOS column pointed to by the address register into the data col-
umn register and then auto-increments the value of the address register. The device must already be in program-
ming mode for this instruction to execute.
DISCHARGE – This instruction is used to discharge the internal programming supply voltage after an erase or pro-
gramming cycle and prepares ispClock5500 for a read cycle.
2
PROGRAM_USERCODE – This instruction writes the contents of the UES register (32 bits) into E
CMOS memory.
The device must already be in programming mode for this instruction to execute.
2
USERCODE – This instruction both reads the UES string (32 bits) from E
CMOS memory into the UES register
and addresses the UES register so that this data may be shifted in and out.
HIGHZ – This instruction forces all outputs into a High-Z state.
CLAMP – This instruction drives I/O pins with the contents of the boundary scan register.
USER_LOGIC_RESET – This instruction resets all user-accessible logic, similar to asserting a HIGH on the
RESET pin.
INTEST – This instruction performs in-circuit functional testing of the device.
ERASE_DONE – This instruction erases the ‘DONE’ bit only. This instruction is used to disable normal operation of
the device while in programming mode until a valid configuration pattern has been programmed.
PROGRAM_DONE – This instruction programs the ‘DONE’ bit only. This instruction is used to enable normal
device operation after programming is complete.
NOOP – This instruction behaves similarly to the CLAMP instruction.
40

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