PIC18LF25K22-E/SO Microchip Technology, PIC18LF25K22-E/SO Datasheet - Page 346
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PIC18LF25K22-E/SO
Manufacturer Part Number
PIC18LF25K22-E/SO
Description
32KB, Flash, 1536bytes-RAM,8-bit Family,nanoWatt XLP 28 SOIC .300in TUBE
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Specifications of PIC18LF25K22-E/SO
Core Processor
PIC
Core Size
8-Bit
Speed
48MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
24
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
256 x 8
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 19x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
28-SOIC (7.5mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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PIC18(L)F2X/4XK22
FIGURE 23-3:
23.5
In many applications, it is desirable to detect a drop
below, or rise above, a particular voltage threshold. For
example, the HLVD module could be periodically
enabled to detect Universal Serial Bus (USB) attach or
detach. This assumes the device is powered by a lower
voltage source than the USB when detached. An attach
would indicate a high-voltage detect from, for example,
3.3V to 5V (the voltage on USB) and vice versa for a
detach. This feature could save a design a few extra
components and an attach signal (input pin).
For general battery applications,
possible voltage curve. Over time, the device voltage
decreases. When the device voltage reaches voltage
V
The interrupt could cause the execution of an ISR,
which would allow the application to perform “house-
keeping tasks” and a controlled shutdown before the
device voltage exits the valid operating range at T
This would give the application a time window,
represented by the difference between T
safely exit.
DS41412D-page 346
A
, the HLVD logic generates an interrupt at time, T
CASE 1:
CASE 2:
Enable HLVD
Enable HLVD
Applications
HLVDIF
HLVDIF
IRVST
IRVST
V
V
DD
DD
HIGH-VOLTAGE DETECT OPERATION (VDIRMAG =
HLVDIF may not be set
Internal Reference is stable
Figure 23-4
A
and T
shows a
Internal Reference is stable
B
Preliminary
, to
T
T
IRVST
IRVST
A
B
.
.
HLVDIF cleared in software,
HLVDIF remains set since HLVD condition still exists
FIGURE 23-4:
V
V
A
B
Legend:
HLVDIF cleared in software
V
V
A
B
1
= HLVD trip point
= Minimum valid device
)
TYPICAL LOW-VOLTAGE
DETECT APPLICATION
2010 Microchip Technology Inc.
operating voltage
Time
HLVDIF cleared in software
T
A
V
V
HLVD
HLVD
T
B
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