NP8P128A13TSM60E Micron Technology Inc, NP8P128A13TSM60E Datasheet - Page 62

• Manufacturer Part Number: NP8P128A13TSM60E
• Manufacturer: Micron Technology Inc

Specifications of NP8P128A13TSM60E

• Lead Free Status / RoHS Status: Supplier Unconfirmed

16.0
16.1
Figure 19: AC Input/Output Reference Waveform
Note:
Figure 20: Transient Equivalent Testing Load Circuit
Table 28: Test configuration component value for worst case speed conditions
16.2
Table 29: Capacitance: T
Datasheet
62
C
C
IN
OUT
Symbol
V
0V
CCQ
AC Characteristics
AC Test Conditions
AC test inputs are driven at V
timing begins/ends at V
case speed occurs at V
Capacitance
Input V
Test Configuration
Output Capacitance
Input Capacitance
Parameter
V
CCQMIN
CCQ
A
/2
(1)
= +25°C, f = 1 MHz (Sampled, not 100% tested)
Under Test
Device
CC
CCQ
= V
/2. Input rise and fall times (10% to 90%) < 5 ns. Worst
Min
CC
CCQ
2
2
C
L
Test Points
Min.
(pF) (includes jig capacitance)
for Logic "1" and 0.0 V for Logic "0." Input/output
C1
Typ
6
4
30
Max
Out
8
7
Numonyx® Omneo™ P8P Datasheet
V
CCQ
Unit
pF
pF
/2 Output
IO_REF.WMF
V
V
Condition
OUT
IN
August 2010
= 0.0 V
= 0.0 V
316144-07