5962-8953702YA QP SEMICONDUCTOR, 5962-8953702YA Datasheet - Page 11

• Manufacturer Part Number: 5962-8953702YA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8953702YA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
4.3.2 Groups C and D inspections.
4.4 Erasing procedure. The recommended erasure procedure for the device is exposure to shortwave ultraviolet light which has
a wavelength of 2537 Angstroms (Å). The integrated dose (i.e., UV intensity x exposure time) for erasure should be a minimum
of 25 Ws/cm 2 . The erasure time with this dosage is approximately 35 minutes using an ultraviolet lamp with a 12000 µW/cm 2
power rating. The device should be placed within 1 inch of the lamp tubes during erasure. The maximum integrated dose the
device can be exposed to without damage is 7258 Ws/cm 2 (1 week at 12000 µW/cm 2 ). Exposure of EPROMS to high intensity
UV light for long periods may cause permanent damage.
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
a.
b.
c.
(1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
(2) T A = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
All devices selected for testing shall be programmed with a checkerboard pattern or equivalent. After completion of all
testing, the devices shall be erased and verified.
COLUMBUS, OHIO 43218-3990
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1005 of MIL-STD-883.
1/
2/
3/
4/
MICROCIRCUIT DRAWING
Interim electrical parameters
Final electrical test parameters
Final electrical test parameters
Group A test requirements
Group C and D end-point electrical
*Indicates PDA applies to subgroups 1 and 7.
Any or all subgroups may be combined when using high-speed testers.
**See 4.3.1c.
As a minimum, subgroups 7 and 8 shall consist of verifying the data pattern.
(method 5004)
(method 5004) for unprogrammed devices
(method 5004) for programmed devices
(method 5004)
parameters (method 5005)
MIL-STD-883 test requirements
STANDARD
TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/
(in accordance with 5005, table I)
1, 2, 3, 4**, 7, 8A, 8B, 9, 10, 11
SIZE
A
1*, 2, 3, 7*, 8A, 8B, 9
1*, 2, 3, 7*, 8A, 8B
2, 3, 7, 8A, 8B
Subgroups
REVISION LEVEL
1
B
SHEET
5962-89537
11