5962-8680502QA QP SEMICONDUCTOR, 5962-8680502QA Datasheet - Page 5

• Manufacturer Part Number: 5962-8680502QA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8680502QA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
See footnotes at end of table.
Input leakage current
Output leakage
Operating current
Standby current
Standby current
V
Input low voltage
Input high voltage
Output low voltage
Output high voltage
Output short-circuit
Input capacitance
Output capacitance
Functional tests
current
(TTL inputs)
(CMOS inputs)
(read)
(TTL)
(TTL)
PP
supply current
DEFENSE SUPPLY CENTER COLUMBUS
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
I
I
I
I
I
I
V
V
V
V
I
C
C
Symbol
LI
LO
CC1
CC2
CC3
PP
OS
4/ 5/
4/ 5/
IL
IH
OL
OH
IN
OUT
3/
1/
2/
2/
V
V
V
0
f = 1/t
V
V
V
I
V
I
V
V
V
f = 1 MHz
See 4.3.1c
TABLE I. Electrical performance characteristics.
CE = OE = V
CE = V
CE = V
OL
OH
V
f = 1 MHz
See 4.3.1c
See 4.3.1e
unless otherwise specified
0-15
IN
OUT
CC
CC
CC
PP
IL
IH
O
IN
OUT
= 2.1 mA
= 0 V
= 0.8 V, V
= -400 µA
= 0 V to 5.5 V
= 2.0 V, V
= 0 V, T
-55°C < T
4.5 V < V
= 5.5 V
= V
= 5.5 V
= 5.5 V
= 0 mA
= 0 V to 5.5 V
AVQV
= 0 V, T
PP
V
IH
CC
Conditions
SS
= 5.5 V
(maximum)
±0.3 V
C
= 0 V;
CC
IH
= +25°C
C
IL
C
IL
< +125°C
= 2.0 V
= 0.8 V
= +25°C
< 5.5 V
SIZE
A
subgroups
Group A
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
7, 8
4
4
REVISION LEVEL
Device
types
01-06,
08
01-06
07-08
01-06
07-08
All
All
07
All
All
All
All
All
All
All
All
All
F
-200
-10
Min
-5
-0.1
2.4
3/
2.0
Limits
SHEET
0.45
+200
+10
120
100
V
25
Max
+5
60
90
20
+0.5
25
5962-86805
1
10
0.8
3/
CC
5
Unit
µA
µA
mA
mA
µA
mA
µA
mA
pF
pF
V
V
V
V