5962-8948403M3A QP SEMICONDUCTOR, 5962-8948403M3A Datasheet - Page 8

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5962-8948403M3A

Manufacturer Part Number
5962-8948403M3A
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-8948403M3A

Lead Free Status / RoHS Status
Supplier Unconfirmed
DSCC FORM 2234
APR 97
Output inactive from
Output inactive from
Output valid from clock
Output valid from E low
1/
2/
3/
4/
5/
6/
E high (Asynchronous
clock (Synchronous
mode) 3/ 6/
mode) 3/ 6/
(Synchronous mode)
(Asynchronous mode) 3/ │
These are absolute values with respect to device ground and all overshoots and undershoots due to system or tester noise
are included.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30
seconds.
Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the
limits specified in table I.
At f = f max , address inputs are cycling at the maximum frequency of 1/t SA .
Unless otherwise specified, AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of
1.5 V, input pulse levels of 0 to 3.0 V, and the output load on figure 3.
Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V
level on the input, C L = 5 pF (including scope and jig). See figure 3.
Test
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
│Symbol │
│t HZS
│t HZE
│t COS
│t DOE
TABLE I. Electrical performance characteristics - Continued.
│ unless otherwise specified
│ See figures 3 and 4 and 5/
-55°C ≤ T C ≤ +125°C
4.5 V ≤ V CC ≤ 5.5 V
Conditions
SIZE
A
│ Group A │ Device │
│ subgroups │ types
│9, 10, 11
│9, 10, 11
│9, 10, 11
│9, 10, 11
REVISION LEVEL
│ 01
│ 02
│ 03
│ 01
│ 02
│ 03
│ 01
│ 02
│ 03
│ 01
│ 02
│ 03
A
│ Min
Limits
│ Max │
│ 25
│ 15
│ 12
│ 25
│ 15
│ 12
│ 25
│ 15
│ 12
│ 25
│ 15
│ 12
SHEET
5962-89484
│ Unit
│ ns
│ ns
│ ns
│ ns
8

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