5962-8946805XC E2V, 5962-8946805XC Datasheet - Page 18

• Manufacturer Part Number: 5962-8946805XC
• Manufacturer: E2V

Specifications of 5962-8946805XC

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
4.3.2 Groups C and D inspections.
f. Devices shall be tested for programmability and ac performance compliance to the requirements of Group A,
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. See 4/ of table II.
e. O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
a. End-point electrical parameters shall be as specified in table II herein.
subgroups 9, 10, and 11. Either of two techniques is acceptable:
(1) Testing all devices submitted for test using additional built-in test circuitry which allows the manufacturer to verify
(2) If such compliance cannot be tested on an unprogrammed device, all samples submitted for testing
changes which may affect capacitance. Sample size is fifteen devices with no failures and all input and output
terminals tested.
affect the performance of the device. Procedures and circuits shall be maintained under document revision level
control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon request.
Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be considered destructive.
Information contained in JEDEC standard number 17 may be used for reference.
DEFENSE SUPPLY CENTER COLUMBUS
programmability and ac performance without programming the user array. If this is done, the resulting test patterns
shall be verified on all devices during subgroups 9, 10, and 11, group A testing per the sampling plan specified in
MIL-STD-883, method 5005.
shall be programmed in accordance with 3.2.3.1 or 3.2.3.2 as applicable. After completion of all
testing, the devices shall be erased and verified except devices submitted to groups C and D testing.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
IN
STANDARD
and C
1/ * indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** see 4.3.1c.
4/ Subgroups 7, 8A, and 8B functional tests shall also verify that no cells
Interim electrical parameters
Final electrical test parameters (method
5004) for programmed devices
Group A test requirements
Groups C and D end-point electrical
parameters (method 5005)
OUT
(method 5004)
(method 5005)
are programmed for unprogrammed devices or that the altered item
drawing pattern exists for programmed devices.
measurement) shall be measured only for the initial test and after process or design
MIL-STD-883 test requirements
TABLE II. Electrical test requirements.
SIZE
A
MIL-STD-883, method
1*, 2, 3, 7*, 8A, 8B, 9
(in accordance with
2, 3, 7, 8A, 8B
5005, table I)
1/ 2/ 3/ 4/
1,2,3,4**,7,
Subgroups
9, 10,11
REVISION LEVEL
1
C
SHEET
5962-89468
18