AT77C104B-CB09YV Atmel, AT77C104B-CB09YV Datasheet - Page 8

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AT77C104B-CB09YV

Manufacturer Part Number
AT77C104B-CB09YV
Description
Manufacturer
Atmel
Datasheet

Specifications of AT77C104B-CB09YV

Lead Free Status / RoHS Status
Compliant
Table 4-3.
Table 4-4.
Table 4-5.
8
Parameter
ESD
On pins HBM (Human Body Model) CMOS I/O
On die surface (zap gun) air discharge
Mechanical Abrasion
Number of cycles without lubricant
Multiply by a factor of 20 for correlation with a real finger
Chemical Resistance
Cleaning agent, acid, grease, alcohol, diluted acetone
Level
I
II
III
IV
V
VI
D
Parameter
Resolution
Size
Yield: Number of bad pixels
Equivalent Resistance on TPP pin
Description
100% production tested at +25°C
100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample)
Sample tested only
Parameter is guaranteed by design and/or characterization testing
Parameter is a typical value only
100% production tested at temperature extremes
100% probe tested on wafer at T
AT77C104B
Resistance
Explanation of Test Levels
Specifications
amb
Symbol
= +25°C
Test Level
IV
IV
I
I
Min
23
Min Value
200,000
4 hours
±16 kV
2 kV
8 × 232
Typ
50
35
MIL-STD-883 method 3015.7
Standard Method
NF EN 6100-4-2
Internal method
Max
MIL E 12397B
47
5
5347F–BIOM–3/08
Bad pixels
Micron
Pixel
Ohm
Unit

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