5962-87664012A QP SEMICONDUCTOR, 5962-87664012A Datasheet - Page 9

• Manufacturer Part Number: 5962-87664012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-87664012A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
4/
10/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic
5/
6/
7/
9/
11/ AC limits at V
8/
The V
The V
V
V
When V
This test may be performed either one input at a time (preferred method) or with all input pins simultaneously at V
alternate test method, the maximum limit is equal to the number of inputs at a high TTL input level times 1.6 mA; and the
preferred method and limits are guaranteed.
Power dissipation capacitance (C
(I
and I
input signal.
patterns used for fault detection. The test vectors used to verify the truth table shall, at a minimum, test all functions of
each input and output. All possible input to output logic patterns per function shall be guaranteed, if not tested, to the
truth table in figure 2 herein. Functional tests shall be performed in sequence as approved by the qualifying activity on
qualified devices. H ≥ 2.5 V, L < 2.5 V; high inputs = 2.4 V and low inputs = 0.4 V. The input voltage levels have the
allowable tolerances in accordance with MIL-STD-883 already incorporated.
for V
delay tests, all paths must be tested.
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND
and the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the
minimum and maximum limits, as applicable, listed herein. All devices shall meet or exceed the limits specified in table I,
as applicable, at 4.5 V ≤ V
V
Three-state output conditions are required.
CC
CC
CC
CC
DEFENSE SUPPLY CENTER COLUMBUS
x V
= 5.5 V. Limits shown apply to operation at V
= 5.5 V with a 2 ms duration maximum. Transmission driving tests may be performed using V
-2.1 V (alternate method). Classes Q and V shall use the preferred method. When the test is performed using the
CC
S
IH
OH
: n is the number of device inputs at TTL levels, f is the frequency of the input signal; and d is the duty cycle of the
MICROCIRCUIT DRAWING
CC
= 5.5 V are 1.0 ns and guaranteed by guardbanding the V
COLUMBUS, OHIO 43218-3990
IN
and V
and V
) + (n x d x ΔI
= V
CC
CC
IL
OL
tests are not required if applied as forcing functions for V
STANDARD
= 5.5 V are equal to the limits at V
or GND is used, the test is guaranteed for V
tests shall be tested at V
CC
x V
CC
TABLE I. Electrical performance characteristics - Continued.
CC
≤ 5.5 V.
). The dynamic current consumption, I
PD
) determines the no load dynamic power consumption, PD = (C
CC
= 4.5 V. The V
CC
CC
= 5.0 V ±0.5 V. Transmission driving tests are performed at
= 4.5 V and guaranteed by testing at V
OH
IN
= 2.0 V or 0.8 V.
and V
SIZE
A
CC
= 4.5 V minimum limits to 1.5 ns. For propagation
OL
S
= (C
tests are guaranteed, if not tested, for
OH
and V
PD
REVISION LEVEL
+ C
OL
L
) V
tests.
CC
C
f + I
CC
CC
+ n x d x ΔI
= 4.5 V. Minimum ac limits
IN
PD
= V
+ C
SHEET
CC
L
5962-87664
) (V
CC
or GND.
. For both P
CC
9
x V
IN
=
CC
)f +
D