SCANSTA111SM National Semiconductor, SCANSTA111SM Datasheet - Page 3

• Manufacturer Part Number: SCANSTA111SM
• Manufacturer: National Semiconductor

Specifications of SCANSTA111SM

• Operating Temperature (min): -40C
• Operating Temperature Classification: Industrial
• Operating Temperature (max): 85C
• Package Type: FBGA
• Rad Hardened: No
• Lead Free Status / RoHS Status: Not Compliant

Architecture
Figure 1
device's major functional blocks are illustrated here. The TAP
Controller, a 16-state state machine, is the central control for
the device. The instruction register and various test data reg-
isters can be scanned to exercise the various functions of the
'STA111 (these registers behave as defined in IEEE Std.
1149.1). The 'STA111 selection controller provides the func-
tionality that allows the 1149.1 protocol to be used in a multi-
drop environment. It primarily compares the address input to
shows the basic architecture of the 'STA111. The
FIGURE 1. SCANSTA111 Block Diagram
3
the slot identification and enables the 'STA111 for subsequent
scan operations. The Local Scan Port Network (LSPN) con-
tains multiplexing logic used to select different port configu-
rations. The LSPN control block contains the Local Scan Port
Controllers (LSPC) for each Local Scan Port (LSP
LSP
struction register, mode registers, and the TAP controller.
Each local port contains all four boundary scan signals need-
ed to interface with the local TAPs plus the optional Test
Reset signal (TRST).
n
). This control block receives input from the 'STA111 in-
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, LSP
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