MPC9608AC IDT, Integrated Device Technology Inc, MPC9608AC Datasheet - Page 9

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MPC9608AC

Manufacturer Part Number
MPC9608AC
Description
IC CLOCK BUFFER ZD 1:10 32-LQFP
Manufacturer
IDT, Integrated Device Technology Inc
Type
Zero Delay Bufferr
Datasheet

Specifications of MPC9608AC

Pll
Yes with Bypass
Input
LVCMOS
Output
LVCMOS
Number Of Circuits
1
Ratio - Input:output
1:10
Differential - Input:output
No/No
Frequency - Max
200MHz
Divider/multiplier
Yes/No
Voltage - Supply
3.135 V ~ 3.465 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
32-LQFP
Frequency-max
200MHz
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MPC9608AC
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Part Number:
MPC9608ACR2
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
IDT™ 1:10 LVCMOS Zero Delay Clock Buffer
Freescale Timing Solutions Organization has been acquired by Integrated Device Technology, Inc
MPC9608
1:10 LVCMOS Zero Delay Clock Buffer
MPC9608
482
The time from the PLL controlled edge to the non controlled edge, divided by the time between PLL
controlled edges, expressed as a percentage.
The variation in cycle time of a signal between adjacent cycles, over a random sample of adjacent
cycle pairs.
The pin-to-pin skew is defined as the worst case difference in propagation delay between any
similar delay path within a single device.
t
Figure 15. Output Transition Time Test Reference
F
Figure 9. Output-to-Output Skew t
Figure 11. Output Duty Cycle (DC)
Figure 13. Cycle-to-Cycle Jitter
T
N
t
P
T
N + 1
T
0
DC = t
t
R
t
SK(O)
T
P
JIT(CC)
/T
V
CC
0
0.55
x 100%
2.4
= 3.3 V
= |T
N
-T
SK(O)
V
V
GND
CC
CC
N + 1
V
V
GND
V
V
GND
CC
CC
CC
CC
÷
÷
÷
2
|
2
2
FREESCALE SEMICONDUCTOR ADVANCED CLOCK DRIVERS DEVICE DATA
9
The deviation in t
The deviation in cycle time of a signal with respect to the ideal period over a random sample of cy-
cles.
CLK_STOP
CCLK
Figure 10. Propagation Delay (t
Figure 16. Setup and Hold Time (t
FB_IN
CCLK
FB_IN
CCLK
0
for a controlled edge with respect to a t
T
0
Figure 14. Period Jitter
t
Figure 12. I/O Jitter
(∅)
Test Reference
t
s
t
H
T
T
PD
JIT(∅)
JIT(PER)
0
mean in a random sample of cycles.
, static phase offset)
s
, t
= |T
H
) Test Reference
= |T
0
- T
N
1
- 1/f
mean|
V
V
GND
V
V
GND
V
V
GND
V
V
GND
0
CC
CC
CC
CC
CC
CC
CC
CC
|
÷
÷
÷
÷
NETCOM
2
2
2
2
MPC9608

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