74LV4051D,118 NXP Semiconductors, 74LV4051D,118 Datasheet - Page 8

IC MUX/DEMUX 8X1 16SOIC

74LV4051D,118

Manufacturer Part Number
74LV4051D,118
Description
IC MUX/DEMUX 8X1 16SOIC
Manufacturer
NXP Semiconductors
Series
74LVr
Type
Analog Multiplexerr
Datasheet

Specifications of 74LV4051D,118

Package / Case
16-SOIC (0.154", 3.90mm Width)
Function
Multiplexer/Demultiplexer
Circuit
1 x 8:1
On-state Resistance
60 Ohm
Current - Supply
80µA
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Propagation Delay Time
23 ns
Supply Voltage (max)
6 V
Supply Voltage (min)
1 V
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Package
16SO
Maximum On Resistance
375@2V Ohm
Maximum Propagation Delay Bus To Bus
25(Typ)@1.2V|9(Typ)@2V|6(Typ)@2.7V|5(Typ)@3.3V|4(Typ)@4.5V|3(Typ)@6V ns
Maximum High Level Output Current
25 mA
Multiplexer Architecture
8:1
Maximum Turn-on Time
145(Typ)@1.2V ns
Power Supply Type
Single
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
74LV4051D-T
74LV4051D-T
935190970118

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
74LV4051D,118
Manufacturer:
NXP/恩智浦
Quantity:
20 000
NXP Semiconductors
Table 7.
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for graphs see
Figure
74LV4051_4
Product data sheet
Symbol
R
Fig 9. Test circuit for measuring OFF-state leakage
R
ON(peak)
ON
V
12.
IH
current
or V
V
Parameter
ON resistance (peak)
ON resistance mismatch
between channels
V
I
ON resistance
CC
= V
IL
CC
I
S
9.1 Test circuits
9.2 ON resistance
or V
V O
EE
and V
S0 to S2
Z
E
O
V
= V
CC
EE
GND = V
Yn
Conditions
V
V
or V
I
I
V
V
V
V
I
V
V
V
V
V
V
I
V
V
= 0 V to V
= 0 V to V
SW
SW
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
EE
.
= 1000 A
= 1000 A
= 1.2 V; I
= 2.0 V; I
= 2.7 V; I
= 3.0 V to 3.6 V;
= 4.5 V; I
= 6.0 V; I
= 1.2 V; I
= 2.0 V; I
= 2.7 V; I
= 3.0 V to 3.6 V;
= 4.5 V; I
= 6.0 V; I
001aak409
CC
CC
Rev. 04 — 10 August 2009
I
S
SW
SW
SW
SW
SW
SW
SW
SW
SW
SW
V I
V
V
EE
EE
= 100 A
= 1000 A
= 1000 A
= 1000 A
= 1000 A
= 100 A
= 1000 A
= 1000 A
= 1000 A
= 1000 A
Fig 10. Test circuit for measuring ON-state leakage
[2]
[2]
current
V
8-channel analog multiplexer/demultiplexer
V
Min
I
IH
= V
-
-
-
-
-
-
-
-
-
-
-
-
or V
40 C to +85 C
GND
CC
IL
Typ
or V
145
90
80
60
55
5
4
4
3
2
-
-
EE
[1]
V I
S0 to S2
Z
and V
E
Max
325
200
180
135
125
V
CC
-
-
-
-
-
-
-
O
= open circuit.
GND = V
Yn
40 C to +125 C Unit
Min
-
-
-
-
-
-
-
-
-
-
-
-
74LV4051
Figure 11
EE
© NXP B.V. 2009. All rights reserved.
I
001aak410
S
Max
375
235
210
160
145
V O
-
-
-
-
-
-
-
and
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