TE28F400CVT80 Intel, TE28F400CVT80 Datasheet - Page 50

• Manufacturer Part Number: TE28F400CVT80
• Manufacturer: Intel

Specifications of TE28F400CVT80

• Cell Type: NOR
• Density: 4Mb
• Access Time (max): 80ns
• Interface Type: Parallel
• Boot Type: Top
• Address Bus: 19/18Bit
• Operating Supply Voltage (typ): 3.3/5V
• Operating Temp Range: -40C to 85C
• Package Type: TSOP
• Sync/async: Asynchronous
• Operating Temperature Classification: Industrial
• Operating Supply Voltage (min): 3/4.5V
• Operating Supply Voltage (max): 3.6/5.5V
• Word Size: 8/16Bit
• Number Of Words: 512K/256K
• Supply Current: 70mA
• Mounting: Surface Mount
• Pin Count: 48
• Lead Free Status / Rohs Status: Not Compliant

4-MBIT SmartVoltage BOOT BLOCK FAMILY
NOTE:
AC test inputs are driven at 2.7 V for a logic “1” and 0.0 V for a logic “0.” Input timing begins, and output timing ends, at 1.35 V.
Input rise and fall times (10% to 90%) <10 ns.
NOTE:
AC test inputs are driven at 3.0 V for a logic “1” and 0.0 V for a logic “0.” Input timing begins, and output timing ends, at 1.5 V.
Input rise and fall times (10% to 90%) <10 ns.
NOTE:
AC test inputs are driven at V
and V
NOTE: See table for component values.
50
DEVICE
UNDER
IL
TEST
(0.8 V
0.45
Figure 22. Test Configuration
0.0
0.0
2.7
3.0
2.4
TTL
). Output timing ends at V
INPUT
INPUT
Figure 19. 2.7 V–3.6 V Input Range and Measurement Points
INPUT
C
L
OH
Figure 20. 3.3 V Input Range and Measurement Points
V
Figure 21. 5 V Input Range and Measurement Points
CC
(2.4 V
R
R
TTL
1
2
1.35
1.5
) for a logic “1” and V
IH
2.0
0.8
and V
SEE NEW DESIGN RECOMMENDATIONS
IL
. Input rise and fall times (10% to 90%) < 10 ns.
OUT
0530_14
TEST POINTS
TEST POINTS
TEST POINTS
OL
(0.45 V
NOTE: C
2.7 V and 3.3 V
Standard Test
5 V Standard Test
Test Configuration
TTL
Test Configuration Component Values
) for a logic “0.” Input timing begins at V
L
includes jig capacitance.
1.35
1.5
2.0
0.8
C
L
OUTPUT
100
OUTPUT
OUTPUT
50
(pF) R
990
580
1
( ) R
IH
(2.0 V
770
390
2
0530_19
0530_12
0530_13
( )
TTL
)