DSPD56367AG150 Freescale Semiconductor, DSPD56367AG150 Datasheet - Page 23

• Manufacturer Part Number: DSPD56367AG150
• Description: DSP Fixed-Point 24-Bit 150MHz 150MIPS 144-Pin LQFP Tray
• Manufacturer: Freescale Semiconductor

Specifications of DSPD56367AG150

• Package: 144LQFP
• Numeric And Arithmetic Format: Fixed-Point
• Maximum Speed: 150 MHz
• Ram Size: 69 KB
• Device Million Instructions Per Second: 150 MIPS

2.16
Freescale Semiconductor
Signal
Name
TDO
TMS
TCK
TDI
JTAG/OnCE Interface
Signal Type
Output
Input
Input
Input
State during
Tri-Stated
Reset
Input
Input
Input
Table 2-15 JTAG/OnCE Interface
DSP56367 Technical Data, Rev. 2.1
Test Clock—TCK is a test clock input signal used to synchronize the JTAG test
logic. It has an internal pull-up resistor.
This input is 3.3V tolerant.
Test Data Input—TDI is a test data serial input signal used for test instructions
and data. TDI is sampled on the rising edge of TCK and has an internal pull-up
resistor.
This input is 3.3V tolerant.
Test Data Output—TDO is a test data serial output signal used for test
instructions and data. TDO is tri-statable and is actively driven in the shift-IR
and shift-DR controller states. TDO changes on the falling edge of TCK.
Test Mode Select—TMS is an input signal used to sequence the test
controller’s state machine. TMS is sampled on the rising edge of TCK and has
an internal pull-up resistor.
This input is 3.3V tolerant.
Signal Description
JTAG/OnCE Interface
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