X28HC64SI-12 Intersil, X28HC64SI-12 Datasheet - Page 12

• Manufacturer Part Number: X28HC64SI-12
• Description: EEPROM Parallel 64K-Bit 8K x 8 5V 28-Pin SOIC W
• Manufacturer: Intersil

Specifications of X28HC64SI-12

• Package: 28SOIC W
• Interface Type: Parallel
• Density: 64 Kb
• Maximum Random Access Time: 120 ns
• Typical Operating Supply Voltage: 5 V
• Organization: 8Kx8
• Data Retention: 100(Min) Year
• Hardware Data Protection: Yes
• Operating Temperature: -40 to 85 °C

ABSOLUTE MAXIMUM RATINGS
Temperature under bias
Storage temperature.......................... -65°C to +150°C
Voltage on any pin with
D.C. output current ............................................... 5mA
Lead temperature
RECOMMENDED OPERATING CONDITIONS
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)
Notes: (1) Typical values are for T
Symbol
X28HC64 ......................................... -10°C to +85°C
X28HC64I, X28HC64M .................. -65°C to +135°C
respect to V
(soldering, 10 seconds).................................. 300°C
Temperature
V
V
V
I
I
V
Commercial
I
I
SB1
SB2
IH
I
lL
CC
LO
OH
Industrial
LI
OL
(2)
Military
(2)
(2) V
IL
V
(TTL inputs)
V
(TTL inputs)
V
(CMOS inputs)
Input leakage current
Output leakage current
Input LOW voltage
Input HIGH voltage
Output LOW voltage
Output HIGH voltage
min. and V
CC
CC
CC
SS
current (active)
current (standby)
current (standby)
......................................... -1V to +7V
Parameter
IH
max. are for reference only and are not tested.
-40°C
-55°C
Min.
0°C
12
A
= 25°C and nominal supply voltage
Min.
2.4
-1
2
+125°C
+70°C
+85°C
Max.
Typ.
Limits
100
15
1
(1)
X28HC64
V
Max.
CC
200
±10
±10
0.8
0.4
40
2
+ 1
COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device (at these or any other conditions above those indi-
cated in the operational sections of this specification) is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
Unit
mA
mA
µA
µA
µA
V
V
V
V
Supply Voltage
CE = OE = V
address inputs = TTL levels @ f = 10 MHz
CE = V
other inputs = V
CE = V
other inputs = V
V
V
I
I
OL
OH
X28HC64
IN
OUT
= 5mA
= V
= -5mA
= V
IH
CC
SS
, OE = V
SS
- 0.3V, OE = GND, All I/O’s = open,
to V
to V
IL
CC
, WE = V
Test Conditions
IH
CC
CC
IL
- 0.3V
, CE = V
All I/O’s = open,
IH
, All I/O’s = open,
IH
5V ±10%
Limits
June 7, 2006
FN8109.1