SI3050-E-GTR Silicon Laboratories Inc, SI3050-E-GTR Datasheet - Page 91

• Manufacturer Part Number: SI3050-E-GTR
• Description: IC VOICE DAA GCI/PCM/SPI 20TSSOP
• Manufacturer: Silicon Laboratories Inc

Specifications of SI3050-E-GTR

• Function: Data Access Arrangement (DAA)
• Interface: PCM, Serial, SPI
• Number Of Circuits: 1
• Voltage - Supply: 3 V ~ 3.6 V
• Current - Supply: 8.5mA
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 20-TSSOP
• Includes: Line Voltage Monitor, Loop Current Monitor, Overload Detection, Parallel Handset Detection, Polarity Reversal Detection, TIP and
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power (watts): -
• Lead Free Status / RoHS Status: Supplier Unconfirmed, Lead free / RoHS Compliant

A
Introduction
Although designs using the Si3011 comply with IEC/
UL60950 3rd Edition and pass all overcurrent and
overvoltage tests, there are still several issues to
consider.
Figure 48 shows two designs that can pass the IEC/
UL60950
emissions. The top schematic shows the configuration
in which the ferrite beads (FB1, FB2) are on the
unprotected side of the sidactor (RV1). For this
configuration, the current rating of the ferrite beads
needs to be 6 A. However, the higher current ferrite
beads are less effective in reducing electromagnetic
emissions.
PPENDIX
overvoltage
600  at 100 MHz, 200 mA
600  at 100 MHz, 200 mA
—IEC/UL60950 3
RV1
tests
Figure 48. Circuits that Pass All Overvoltage Tests
FB1
FB2
and
electromagnetic
RD
E
DITION
Rev. 1.11
RV1
The bottom schematic of Figure 48 shows the
configuration in which the ferrite beads (FB1, FB2) are
on the protected side of the sidactor (RV1). For this
design, the ferrite beads can be rated at 200 mA.
In a cost optimized design, it is important to remember
that compliance to IEC/UL60950 does not always
require overvoltage tests. It is best to plan ahead and
know which overvoltage tests applies to your system.
System-level elements in the construction, such as fire
enclosure
considered during the design stages. Consult with your
professional testing agency during the design of the
product to determine which tests apply to your system.
1.25 A
75  @ 100 MHz, 6 A
and
1.25 A
75  @ 100 MHz, 6 A
spacing
Si3050 + Si3011
FB1
FB2
requirements,
C8
C8
C9
C9
RING
RING
TIP
TIP
must
be
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