NOIL1SE3000A-GDC ON Semiconductor, NOIL1SE3000A-GDC Datasheet - Page 30

• Manufacturer Part Number: NOIL1SE3000A-GDC
• Manufacturer: ON Semiconductor

Specifications of NOIL1SE3000A-GDC

• Lead Free Status / Rohs Status: Supplier Unconfirmed

Testpattern 0-31 Registers (b1100000- 1111111 / d96-127)
LVDS data recovery calibration, alignment, and testing. A
unique test pattern is programmed for each data channel and
Table 45. TEST PATTERN REGISTERS
Testpattern0
Testpattern1
Testpattern2
Testpattern3
Testpattern4
Testpattern5
Testpattern6
Testpattern7
Testpattern8
Testpattern9
Testpattern10
Testpattern11
Testpattern12
Testpattern13
Testpattern14
Testpattern15
Testpattern16
Testpattern17
Testpattern18
Testpattern19
Testpattern20
Testpattern21
Testpattern22
Testpattern23
Testpattern24
Testpattern25
Testpattern26
Testpattern27
Testpattern28
Testpattern29
Testpattern30
Testpattern31
A register is provided for each of the 32 data channels for
Register
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Startup Value
b00000001
b00000001
b00000010
b00000010
b00000100
b00000100
b00001000
b00001000
b00010000
b00010000
b00100000
b00100000
b01000000
b01000000
b10000000
b10000000
b10000000
b10000000
b01000000
b01000000
b00100000
b00100000
b00010000
b00010000
b00001000
b00001000
b00000100
b00000100
b00000010
b00000010
b00000000
b00000000
30
routed to the LVDS outputs by bypassing the ADCs and
disabling the training mode (setting bypass_en and clearing
training_en, both contained in register d11).