ATxmega32A4 Atmel Corporation, ATxmega32A4 Datasheet - Page 96

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ATxmega32A4

Manufacturer Part Number
ATxmega32A4
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of ATxmega32A4

Flash (kbytes)
32 Kbytes
Pin Count
44
Max. Operating Frequency
32 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
34
Ext Interrupts
34
Usb Speed
No
Usb Interface
No
Spi
7
Twi (i2c)
2
Uart
5
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
12
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
2
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
12
Temp. Sensor
Yes
Crypto Engine
AES/DES
Sram (kbytes)
4
Eeprom (bytes)
1024
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.6 to 3.6
Operating Voltage (vcc)
1.6 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
5
Output Compare Channels
16
Input Capture Channels
16
Pwm Channels
16
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

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8069Q–AVR–12/10
11. Sampled BOD in Active mode will cause noise when bandgap is used as reference
12. DAC is nonlinear and inaccurate when reference is above 2.4V or VCC - 0.6V
13.
14. EEPROM page buffer always written when NVM DATA0 is written
15. Pending full asynchronous pin change interrupts will not wake the device
16. Pin configuration does not affect Analog Comparator output
Problem fix/Workaround
Do not set the BOD level higher than VCC even if the BOD is not used.
Using the BOD in sampled mode when the device is running in Active or Idle mode will add
noise on the bandgap reference for ADC, DAC and Analog Comparator.
Problem fix/Workaround
If the bandgap is used as reference for either the ADC, DAC or the Analog Comparator, the
BOD must not be set in sampled mode.
Using the DAC with a reference voltage above 2.4V or VCC - 0.6V will give inaccurate out-
put when converting codes that give below 0.75V output:
– ±10 LSB for continuous mode
– ±200 LSB for Sample and Hold mode
Problem fix/Workaround
None.
DAC has increased INL or noise for some operating conditions
Some DAC configurations or operating condition will result in increased output error.
– Continous mode: ±5 LSB
– Sample and hold mode: ±15 LSB
– Sample and hold mode for reference above 2.0v: up to ±100 LSB
Problem fix/Workaround
None.
If the EEPROM is memory mapped, writing to NVM DATA0 will corrupt data in the EEPROM
page buffer.
Problem fix/Workaround
Before writing to NVM DATA0, for example when doing software CRC or flash page buffer
write, check if EEPROM page buffer active loading flag (EELOAD) is set. Do not write NVM
DATA0 when EELOAD is set.
Any full asynchronous pin-change Interrupt from pin 2, on any port, that is pending when the
sleep instruction is executed, will be ignored until the device is woken from another source
or the source triggers again. This applies when entering all sleep modes where the System
Clock is stopped.
Problem fix/Workaround
None.
The Output/Pull and inverted pin configuration does not affect the Analog Comparator
output.
Problem fix/Workaround
None for Output/Pull configuration.
XMEGA A4
96

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