S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 83

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

Chapter 6: Creating Test Patterns
78
(1) Input-leakage-current test (I
(2) Pull-up-current test (I
(3) Pull-down-current test (I
(4) Off-state leakage current (I
Measure the input current-related parameters of an input buffer that does not have a
pull-up or pull-down resistor attached.
The current that flows through the input buffer when a high voltage is applied is
referred to as “I
be performed, the test pattern must have an event in which the measured pin has a
high signal entered. If the measured pin is a bidirectional pin, it must be set for
input, with a high signal entered.
The current that flows through the input buffer when a low voltage is applied is
referred to as “I
be performed, the test pattern must have an event in which the measured pin has a
low signal entered. If the measured pin is a bidirectional pin, it must be set for input,
with a low signal entered.
Measure the current that flows through the input buffer with a pull-up resistor
attached when a low voltage is applied to it. For this test to be performed, the test
pattern must have an event in which the measured pin has a low signal entered. If
the measured pin is a bidirectional pin, it must be set for input, with a low signal
entered.
Measure the current that flows through the input buffer with a pull-down resistor
attached when a high voltage is applied to it. For this test to be performed, the test
pattern must have an event in which the measured pin has a high signal entered. If
the measured pin is a bidirectional pin, it must be set for input, with a high signal
entered.
Measure the leakage current that flows in an open-drain tri-state output buffer while
its outputs are in the Hi-Z state. This test is actually performed by measuring the
current flowing through the measured pin while in the Hi-Z state, when the V
voltage and V
must have an event in which the measured pin is placed in the high-impedance
state.
SS
IH
IL
,” and is guaranteed by the maximum current value. For this test to
voltage is applied to it, respectively. Therefore, the test pattern
,” and is guaranteed by the maximum current value. For this test to
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PD
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OZ
IH
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, I
IL
EPSON
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