BUK127-50DL NXP Semiconductors, BUK127-50DL Datasheet - Page 7

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BUK127-50DL

Manufacturer Part Number
BUK127-50DL
Description
Buk127-50dl Powermos Transistor Logic Level Topfet
Manufacturer
NXP Semiconductors
Datasheet
Philips Semiconductors
October 2001
PowerMOS transistor
Logic level TOPFET
400
300
200
100
Fig.16. Test circuit for resistive load switching times.
2.8
2.6
2.4
2.2
1.8
1.6
1.4
1.2
Fig.15. Overvoltage clamping characteristic, 25˚C.
3
2
1
0
-50
56
VISR / V
ID / mA
VIS
I
D
Fig.14. Typical Protection reset voltage.
= f(V
-25
58
DS
); conditions: V
0
V
ISR
60
= f(T
25
TYP.
V
TOPFET
IS
j
I
); t
Tj / C
= 5 V
50
VDS / V
62
lr
RL
= 100 s.
P
IS
= 0 V; t
D
S
75
VDD
64
D.U.T.
measure
p
100
VDS
300 s
BUK127-50DL
BUK127-50DL
66
125
0V
150
68
7
R
Fig.17. Typical switching waveforms, resistive load .
100 nA
10 nA
L
10 uA
15
10
1 uA
5
0
= 50 ; adjust V
Fig.18. Typical drain source leakage current
-40
I
DSS
VIS & VDS / V
-50
IDSS
= f(T
-20
j
); conditions: V
0
0
20
DD
VIS
to obtain I
40
time / us
60
Tj / C
50
DS
= 40 V; V
D
80
= 250 mA; T
BUK127-50DL
Product specification
100
100
120
BUK127-50DL
IS
VDS
BUK127-50DL
= 0 V.
Rev 1.011
140
j
= 25˚C
160
150

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