L64767 LSI Logic Corporation, L64767 Datasheet - Page 15

• Manufacturer Part Number: L64767
• Description: Smatv Qam Encoder
• Manufacturer: LSI Logic Corporation

Test Signals
The eight signals described below control functions such as chip-level,
full scan tests, JTAG tests, and internal RAM tests. Five pins (TCK, TDI,
TDO, TMS, and TRST) are used for JTAG tests. The other three pins are
for SCAN_ENABLE, SCAN_MODE, and T_N (test output enable). Note
that the L64767 is in normal functional mode when SCAN_ENABLE,
SCAN_MODE, TCK, TDI, TMS, T_N, and TRST are left unconnected.
SCAN_ENABLE
SCAN_MODE Scan Mode
TCK
TDI
TDO
TMS
T_N
L64767 SMATV QAM Encoder
Scan Enable
This is a level-sensitive data signal with a pull-down
resistor. When HIGH, this signal enables scan chain shift.
In default normal operation, SCAN_ENABLE is LOW.
This is a level-sensitive signal with a pull-down resistor.
When this signal is HIGH, the chip is switched to scan
test mode. In default normal operation, SCAN_MODE is
LOW.
Test Mode Clock
When HIGH, this is a rising or falling edge signal for the
JTAG test mode clock. In default normal operational
mode, TCK is LOW.
Test Data Input
When HIGH, this level-sensitive signal provides JTAG
data input. In default normal operational mode, TDI is
LOW.
Test Data
This is the JTAG data output.
Test Mode Select
When HIGH, this level-sensitive signal enables the JTAG
test mode. In default normal operational mode, TMS is
LOW.
Test Output Enable
This is an active LOW signal with a pull-up resistor that
disables the test mode when T_N is LOW. It switches all
3-stated buffers to high-impedance mode for test or
device selection on a common bus. In default normal
operation, T_N is HIGH.
Output
Input
Input
Input
Input
Input
Input
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