HY29F400 Hynix Semiconductor, HY29F400 Datasheet - Page 17

• Manufacturer Part Number: HY29F400
• Description: 4 Megabit (512Kx8/256Kx16) 5 Volt-only Flash Memory
• Manufacturer: Hynix Semiconductor

While the Automatic Erase algorithm is operating,
successive read cycles at any address cause
DQ[6] to toggle. DQ[6] stops toggling when the
erase operation is complete or when the device is
placed in the Erase Suspend mode. The host may
use DQ[2] to determine which sectors are erasing
or erase-suspended (see below). After an Erase
command sequence is written, if all sectors se-
lected for erasing are protected, DQ[6] toggles for
approximately 100 µs, then returns to reading ar-
ray data. If at least one selected sector is not
protected, the Automatic Erase algorithm erases
the unprotected sectors, and ignores the selected
sectors that are protected.
DQ[2] - Toggle Bit II
Toggle Bit II, DQ[2], when used with DQ[6], indi-
cates whether a particular sector is actively eras-
ing or whether that sector is erase-suspended.
Toggle Bit II is valid after the rising edge of the
final WE# pulse in the command sequence. The
device toggles DQ[2] with each OE# or CE# read
cycle.
DQ[2] toggles when the host reads at addresses
within sectors that have been selected for erasure,
but cannot distinguish whether the sector is ac-
tively erasing or is erase-suspended. DQ[6], by
comparison, indicates whether the device is ac-
tively erasing or is in Erase Suspend, but cannot
distinguish which sectors are selected for erasure.
Thus, both status bits are required for sector and
mode information.
Figure 8 illustrates the operation of Toggle Bits I
and II.
DQ[5] - Exceeded Timing Limits
DQ[5] is set to a ‘1’ when the program or erase
time has exceeded a specified internal pulse count
limit. This is a failure condition that indicates that
the program or erase cycle was not successfully
completed. DQ[5] status is valid only while DQ[7]
or DQ[6] indicate that the Automatic Algorithm is
in progress.
Rev. 5.2/May 01
Note: In the current version of the device, unreliable
testing of DQ[6] for erase completion may occur if the
test is done before the Sector Erase Timer (DQ[3]) has
expired. It is recommended that for erase operations
the DQ[6] test be delayed for a minimum of 100 µs or
until after DQ[3] switches from a ‘0’ to a ‘1’. This anomaly
will be corrected in a future revision of the device.
The DQ[5] failure condition will also be signaled if
the host tries to program a ‘1’ to a location that is
previously programmed to ‘0’, since only an erase
operation can change a ‘0’ to a ‘1’.
For both of these conditions, the host must issue
a Read/Reset command to return the device to
the Read mode.
DQ[3] - Sector Erase Timer
After writing a Sector Erase command sequence,
the host may read DQ[3] to determine whether or
not an erase operation has begun.
sector erase time-out expires and the sector erase
operation commences, DQ[3] switches from a ‘0’
to a ‘1’. Refer to the “Sector Erase Command”
section for additional information. Note that the
Notes:
1. During programming, the program address.
2. Recheck DQ[7] since it may change asynchronously at the same time
During sector erase, an address within any non-protected sector
scheduled for erasure.
During chip erase, an address within any non-protected sector.
as DQ[5].
Figure 7. Data# Polling Test Algorithm
N O
EXCEEDED TIME ERROR
at Valid Address (Note 1)
at Valid Address (Note 1)
PROGRAM/ERASE
DQ[7] = Data?
DQ[7] = Data?
Read DQ[7:0]
Read DQ[7:0]
DQ[5] = 1?
(Note 2)
START
YES
N O
N O
Test for DQ[7] = 1?
for Erase Operation
Test for DQ[7] = 1?
for Erase Operation
YES
YES
PROGRAM/ERASE
COMPLETE
HY29F400
When the
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