HY27UH088GDM Hynix Semiconductor, HY27UH088GDM Datasheet - Page 3

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HY27UH088GDM

Manufacturer Part Number
HY27UH088GDM
Description
8G-Bit NAND Flash Memory
Manufacturer
Hynix Semiconductor
Datasheet
FEATURES SUMMARY
SUPPLY VOLTAGE
= 2.7 to 3.6V : HY27UH088G(2/D)M
Memory Cell Array
PAGE SIZE
BLOCK SIZE
COPY BACK PROGRAM MODE
CACHE PROGRAM MODE
FAST BLOCK ERASE
Rev 0.5 / Oct. 2005
HIGH DENSITY NAND FLASH MEMORIES
- Cost effective solutions for mass storage applications
NAND INTERFACE
- x8 bus width.
- Multiplexed Address/ Data
- Pinout compatibility for all densities
- 3.3V device: VCC
- x8 device : (2K + 64 spare) Bytes
- x8 device: (128K + 4K spare) Bytes
PAGE READ / PROGRAM
- Random access: 30us (max.)
- Sequential access: 50ns(min.)
- Page program time: 200us (typ.)
- Fast page copy without external buffering
- Internal Cache Register to improve the program
- Block erase time: 2ms (Typ.)
throughput
= (2K+ 64) Bytes x 64 Pages x 8,192 Blocks
: HY27UH088G(2/D)M
STATUS REGISTER
ELECTRONIC SIGNATURE
CHIP ENABLE DON'T CARE OPTION
AUTOMATIC PAGE 0 READ AT POWER-UP OPTION
HARDWARE DATA PROTECTION
DATA INTEGRITY
PACKAGE
- HY27UH088GDM-MP
SERIAL NUMBER OPTION
- Manufacturer Code
- Device Code
- Simple interface with microcontroller
- Boot from NAND support
- Automatic Memory Download
- Program/Erase locked during Power transitions
- 100,000 Program/Erase cycles
- 10 years Data Retention
- HY27UH088G2M-T(P)
: 48-Pin TSOP1 (12 x 20 x 1.2 mm)
- HY27UH088G2M-T (Lead)
- HY27UH088G2M-TP (Lead Free)
- HY27UH088GDH-MP (Lead Free)
: 52-TLGA (12 x 17 x 1.0mm)
8Gbit (1Gx8bit) NAND Flash
HY27UH088G(2/D)M Series
Preliminary
3

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