AN1526 Freescale Semiconductor / Motorola, AN1526 Datasheet - Page 15

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AN1526

Manufacturer Part Number
AN1526
Description
RF Power Device Impedances: Practical Considerations
Manufacturer
Freescale Semiconductor / Motorola
Datasheet
(10) S. R. Mazumder and P. D. van der Puije,
(11) S. R. Mazumder and P. D. van der Puije, “An
(12) William P. Overstreet and William A. Davis, “Measuring
(13) R. Hejhall, “Systemizing RF Power Amplifier Design,”
(14) C. W. Bostain, H. L. Krauss, and F. H. Raab, Solid State
(15) C. Bowick, RF Circuit Design , Howard W. Sams &
(16) Rodney
(17) Dennis Poulin, “Load–Pull Measurements Help You
(18) Hiroyuki Abe and Yoichi Aono “11–GHz GaAs Power
(19) G. P. Bava, U. Pisani, and V. Pozzolo, “Active Load
(20) Joseph M. Cusack, Stewart M. Perlow, and Barry S.
(21) David Zemack, “A New Load Pull Measurement
MOTOROLA SEMICONDUCTOR APPLICATION INFORMATION
(7) W. H. Leighton, R. J. Chaffin, and J. G. Webb, “RF
(8) S. R. Mazumder, “Two–Signal Method of Measuring the
(9) S. R. Mazumder, “Characterization and Design of
Amplifier Design with Large–Signal S–Parameters,”
IEEE
Techniques, MTT–21, 809–814, December 1973.
Large–Signal S–Parameters of Transistors,” IEEE
Transactions on Microwave Theory and Techniques,
vol. MTT–26, 417–420, June 1978.
Microwave Class C Transistor Power Amplifier,” Ph.D.
dissertation, Carleton University, Ottawa, Canada,
1976.
“Characterization of Nonlinear 2–Ports for the Design of
Class–C
Acoustics, vol. 1, No. 4, 139–142, July 1977.
Experimental Method of Characterizing Nonlinear
2–Ports and Its Application to Microwave Class–C
Transistor Power Amplifier Design,” IEEE Journal of
Solid–State Circuits, vol. SC–12, no. 5, October 1977.
Parameters of Large–Signal Nonlinear Devices,”
Microwaves & RF, 91–96, November 1987.
Motorola
Semiconductor Products, Inc., Phoenix, Arizona,
August 1968.
Radio Engineering , John Wiley & Sons, Inc., New York,
1980, pp 406–408.
Company, Indianapolis, 1982.
“Computer–Aided Error Correction of Large–Signal
Load–Pull Measurements,” IEEE Transactions on
Microwave Theory and Techniques, vol. MTT–32, No.
3, March 1984.
Meet Your Match,” Microwaves, pp. 61–65, Nov. 1980.
MESFET Load–Pull Measurements Utilizing a New
Method of Determining Tuner Y Parameters,” IEEE
Trans. Microwave Theory and Techniques, vol. 27, no.
5, pp. 394–399, May 1979.
Technique for Load–Pull Characterisation at Microwave
Frequencies,” Electronics Lett., vol. 18, no. 4, pp.
178–179, February 1982.
Perlman, “Automatic Load Contour Mapping for
Microwave Power Transistors.” IEEE Trans. Microwave
Theory and Techniques, vol. MTT–22, vol. 12, pp.
1146–1152, December 1974.
Technique Eases GaAs Characterization,” Microwave
Journal, pp. 63–67, November 1980.
Transactions
S.
Amplifiers,”
Application
Tucker
on
Microwaves,
and
Note
Microwave
Freescale Semiconductor, Inc.
For More Information On This Product,
Peter
AN–282,
D.
Go to: www.freescale.com
Theory
Optics
Motorola
Bradley,
and
and
(22) Rodney S. Tucker, “RF Characterization of Microwave
(23) Yoichiro Takayama, “A New Load–Pull Characterization
(24) A. M. Khilla, “Accurate Measurement of High–Power
(25) Roger B. Stancliff and Dennis D. Poulin, “Harmonic
(26) Ronald R. Bauer and Paul Penfield, “De–Embedding
(27) Lawrence Dunleavy and P. B. Katehi, “Eliminate
(28) Lance A. Glasser, “An Analysis of Microwave
(29) Michael Hillbun, “Compensate Analyzer Errors and
(30) Richard Lane, “De–Embedding Device Scattering
(31) Dan Swanson, “Ferret Out Fixture Errors With Careful
(32) Jim
(33) I. Kasa, “Closed–Form Mathematical Solutions to Some
(34) W. Kruppa and K. F. Sodomsky, “An Explicit Solution for
(35) Daniel N. Meeks, “Re–Normalizing the Scattering
(36) Stig Rehnmark, “On the Calibration Process of
(37) H.
Power FET’s,” IEEE Trans. Microwave Theory and
Techniques, vol. MTT–29, vol. 8, pp. 776–781, August
1981.
Method for Microwave Transistors,” Proc. IEEE MTT–S,
pp. 218–220, June 1976.
GaAs FET Terminating Impedances Improves Device
Characterization,” Microwave Journal, pp. 255–263,
1985.
Load–Pull,” Proc. IEEE MTT–S, pp. 185–187, May
1979.
and Unterminating,” IEEE Trans. Microwave Theory
and Techniques, vol. MTT–22, vol. 3, pp. 282–288,
March 1974.
Surprises when De–Embedding Microstrip Launches,”
Microwave & RF, pp. 117–112, August 1987.
De–Embedding Errors,” IEEE Trans. Microwave
Theory and Techniques, vol. MTT–26, vol. 5, pp.
379–380, May 1978.
De–Embed S–Parameters,” Microwaves, pp. 87–92,
January 1980.
Parameters,” Microwave Journal, pp. 149–156, August
1984.
Calibration,” Microwaves, pp. 79–86, January 1980.
Measurement,” Microwave Journal, pp. 63–66, May
1978.
Network Analyzer Calibration Equations,” IEEE Trans.
Instrumentation and Measurement, vol. IM–23, vol. 4,
pp. 399–402, December 1974.
the Scattering Parameters of a Linear Two–Port
Measured with an Imperfect Test Set,” IEEE Trans.
Microwave Theory and Techniques, vol. MTT–19, vol.
1, pp. 122–123, January 1971.
Parameters,” RF Design, pp. 41–42.
Automatic Network Analyzer Systems,” IEEE Trans.
Microwave Theory and Techniques, vol. MTT–24, vol.
4, pp. 457–458, April 1974.
Computer–Corrected S–Parameter Characterisation of
Devices Mounted in Microstrip,” Electronics Lett., vol. 9,
no. 14, July 1973.
V.
Fitzpatrick,
Schurmer,
“Error
“Calibration
Models
Procedure
for
System
15
for

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