MT28F004B5 Micron, MT28F004B5 Datasheet - Page 20

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MT28F004B5

Manufacturer Part Number
MT28F004B5
Description
FLASH MEMORY
Manufacturer
Micron
Datasheet

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TEST CONDITION 2
(0°C ≤ T
NOTE: 1. Measurements tested under AC Test Condition 1.
4Mb Smart 5 Boot Block Flash Memory
F44_B.p65 – Rev. 7/02
READ TIMING PARAMETERS
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
TEST CONDITION 1
Commercial Temperature (0°C ≤ T
AC CHARACTERISTICS
PARAMETER
READ cycle time
Access time from CE#
Access time from OE#
Access time from address
RP# HIGH to output valid delay
OE# or CE# HIGH to output in High-Z
Output hold time from OE#, CE# or address change
RP# LOW pulse width
AC CHARACTERISTICS
PARAMETER
READ cycle time
Access time from CE#
Access time from OE#
Access time from address
RP# HIGH to output valid delay
OE# or CE# HIGH to output in High-Z
Output hold time from OE#, CE# or address change
RP# LOW pulse width
2. OE# may be delayed by
3. Measurements tested under AC Test Condition 2.
A
≤ +70°C; V
CC
= +5V ±5%)
t
ACE minus
A
≤ +70°C) and Extended Temperature (-40°C ≤ T
t
AOE after CE# falls before
SMART 5 BOOT BLOCK FLASH MEMORY
20
Micron Technology, Inc., reserves the right to change products or specifications without notice.
t
SYMBOL
ACE is affected.
t
t
t
RWH
AOE
t
t
t
t
ACE
t
AA
OD
OH
RC
RP
SYMBOL
MIN
70
60
t
t
0
t
RWH
AOE
t
t
t
t
ACE
t
AA
OD
OH
RC
RP
-6
A
MAX
≤ +85°C); V
500
70
35
70
20
MIN
60
60
0
MIN
80
60
0
-8/-8 ET
-6
CC
MAX
500
MAX UNITS NOTES
60
30
60
15
500
20
80
40
80
= +5V ±10%
©2002, Micron Technology, Inc.
UNITS NOTES
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4Mb
1, 2
1, 2
2, 3
2, 3
1
1
1
1
1
1
3
3
3
3
3
3

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