mc145201 Freescale Semiconductor, Inc, mc145201 Datasheet - Page 6

• Manufacturer Part Number: mc145201
• Description: 2.0 Ghz Pll Frequency Synthesizer
• Manufacturer: Freescale Semiconductor, Inc

*If lower frequency is desired, use wave shaping or higher amplitude sinusoidal signal.
LOOP SPECIFICATIONS
*
Symbol
OUTPUT
MC145201
6
GENERATOR
Characteristic Impedance
f XTAL
SINE WAVE
t TLH ,
t THL
f out
C in
V in
f ref
C1
C2
t w
f
Input Voltage Range, f in
Input Frequency, REF in
Externally Driven in
Reference Mode
Crystal Frequency, Crystal Mode
Output Frequency, REF out
Operating Frequency of the Phase Detectors
Output Pulse Width, LD, R , and
Output Transition Times, LD, V , and R
Input Capacitance, REF in
50%
Figure 9. Test Circuit–Crystal Mode
V ,
Figure 11. Switching Waveform
50
REF in
REF out
V CC
90%
10%
*
Figure 7. Test Circuit
DEVICE
UNDER
TEST
GND
t THL
OUTPUT A
V in
1000 pF
1000 pF
V DD
Parameter
(V DD = V CC = 4.5 to 5.5 V unless otherwise indicated, T A = – 40 to + 85 C)
ARCHIVED BY FREESCALE SEMICONDUCTOR, INC. 2005
t w
f in
V CC
f in
(f R )
V+
OUTPUT A
POINT
TEST
DEVICE
UNDER
GND
TEST
V DD
(f v )
t TLH
V+
POINT
TEST
500 MHz
V in
V in
C1
Capacitance
C L = 30 pF
f R in Phase with f V , C L = 50 pF,
V PD = 5.5 V, V DD = V CC = 5.0 V
C L = 50 pF, V PD = 5.5 V,
V DD = V CC = 5.0 V
30 pF, C2
400 mV p–p
1 V p–p
Test Condition
f in
GENERATOR
SINE WAVE
2000 MHz
30 pF, Includes Stray
REF out
MOTOROLA WIRELESS SEMICONDUCTOR
Figure 8. Test Circuit–Reference Mode
DEVICE
UNDER
TEST
Figure 10. Switching Waveform
50
Figure 12. Test Circuit
50%
Figure
Figure
V in
10, 12
11, 12
11, 12
0.01 F
No.
—
7
8
9
SOLUTIONS DEVICE DATA
1/f REF out
TEST POINT
C L
REF in
V CC
Operating Range
*
Min
4.5*
200
12
17
dc
dc
—
—
Guaranteed
*
2
DEVICE
UNDER
Includes all probe and
fixture capacitance.
TEST
GND
OUTPUT A
REF out
V DD
1500
Max
27
27
15
10
85
65
2
5
(f R )
V+
mV p–p
POINT
POINT
TEST
TEST
MHz
MHz
MHz
MHz
Unit
ns
ns
pF