tda8026 NXP Semiconductors, tda8026 Datasheet - Page 38

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tda8026

Manufacturer Part Number
tda8026
Description
Multiple Smart Card Slot Interface Ic
Manufacturer
NXP Semiconductors
Datasheet

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NXP Semiconductors
TDA8026_1
Product data sheet
8.11 Fault detection
The fall time is calculated from 90 % to 10 % of the signal amplitude. The default setting
for IO_SR[0]/IO_SR[2] (low) and IO_SR[1]/IO_SR[3] (high) is LOW (see table
page
The following fault conditions are monitored by the TDA8026.
Overheating: All the card slots are automatically deactivated and the device is forced
in to Standby mode when the detected temperature range is between
125 C to 209 C. The card slot PROT bit is set to logic 1. Above 209 C the device is
shutdown.
Card removal during transaction: A deactivation sequence is performed in
accordance with the EMV 4.2 standard.
DC-to-DC converter overload: All card slots are automatically deactivated and the
device is placed in Standby mode when the current supplied by the DC-to-DC
converter exceeds 170 mA (I
logic 1
Card slot current limitation and deactivation: A current level drawn by a card which
exceeds 120 mA (I
faulty card slot. During the deactivation, the current is limited to approximately
110 mA. The card slot PROT bit is set to logic 1
V
card slot deactivation followed by a device reset. The completion of this phase is
validated when the SUPL bits are set to logic 1.
37).
DD
or V
DD(INTF)
All information provided in this document is subject to legal disclaimers.
dropping: A voltage drop occurring on V
sd
Rev. 1 — 9 March 2010
parameter for V
CC
parameter for V
CC(n)
) triggers the deactivation sequence on the
Multiple smart card slot interface IC
CC(n)
). The card slot PROT bit is set to
DD
or V
DD(iNTF)
TDA8026
© NXP B.V. 2010. All rights reserved.
generates
Table 39 on
38 of 59

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