mpc5553 Freescale Semiconductor, Inc, mpc5553 Datasheet - Page 9
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mpc5553
Manufacturer Part Number
mpc5553
Description
Mpc5553 High Performance Microcontroller
Manufacturer
Freescale Semiconductor, Inc
Datasheet
1.MPC5553.pdf
(66 pages)
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3.3
The MPC5553 is available in packaged form. Package options are listed in
Information.”
Refer to
3.4
1
2
3
3.5
1
2
Freescale Semiconductor
ESD for Human Body Model (HBM)
HBM circuit description
ESD for Field Induced Charge Model (FDCM)
Number of pulses per pin:
Interval of pulses
Spec
EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing was performed on the MPC5554
and applied to the MPC5500 family as generic EMI performance data.
Measured with single-chip EMI program.
Measured with expanded EMI program.
All ESD testing conforms to CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.
Device failure is defined as: if after exposure to ESD pulses, the device no longer meets the device specification requirements.
Complete DC parametric and functional testing will be performed per applicable device specification at room temperature
followed by hot temperature, unless specified otherwise in the device specification.
1
2
3
4
5
6
7
Positive pulses (HBM)
Negative pulses (HBM)
Scan range
Operating frequency
V
V
V
Maximum amplitude
Operating temperature
DD
DDSYN
PP
Section 4, “Mechanicals,”
, V
Package
EMI (Electromagnetic Interference) Characteristics
ESD Characteristics
operating voltages
DDEH
, V
RC33
, V
DDA
, V
Characteristic
DD33
operating voltages
Characteristic
, V
FLASH
, V
MPC5553 Microcontroller Data Sheet, Rev. 2.0
DDE
Table 4. EMI Testing Specifications
for pinouts and package drawings.
operating voltages
Table 5. ESD Ratings
Symbol
Minimum
R1
—
—
—
C
0.15
—
—
—
—
—
—
1, 2
1
750 (corner pins)
500 (all pins)
Typical
Value
1.5
3.3
5.0
2000
1500
—
—
—
—
100
Section 2, “Ordering
1
1
1
Electrical Characteristics
Maximum
1000
132
14
32
—
25
—
—
2
3
second
Unit
pF
—
—
V
Ω
V
dBuV
MHz
MHz
Unit
o
V
V
V
C
9