pnx8526 NXP Semiconductors, pnx8526 Datasheet - Page 56
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pnx8526
Manufacturer Part Number
pnx8526
Description
Programmable Source Decoder With Integrated Peripherals
Manufacturer
NXP Semiconductors
Datasheet
1.PNX8526.pdf
(65 pages)
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Philips Semiconductors
9397 750 15101
Product data sheet
13.2 Lifetime versus temperature
[1]
[2]
The relationship between operating (junction) temperature and the expected lifetime of a
device is shown in
As shown in
expected (at 8 hours per day). If the junction temperature is increased to 125 C, the
lifetime can be reduced to 4 years. The junction temperature can be influenced by
following the guidelines given in
Fig 19. Lifetime dependency on temperature
The new connections are:
a) V
b) V
c) V
The new connections are:
a) V
b) V
DD1
DD2
DD3
DDC1
DDC2
Useful life (years) as a function of junction temperature ( C); 1 % cumulative failures;
8 hours/day.
- the input/output supply connection
- analog clock generation unit; Custom Analog Block (CAB)
- Trimedia clock generation PLL.
- main core supply connection
- 1.728GHz PLL supply connection.
Figure
Figure
(years)
useful
19, at a junction temperature of 110 C a 10 year lifetime can be
life
Rev. 02 — 11 July 2005
25
20
15
10
5
0
100
Programmable source decoder with integrated peripherials
19.
Section
105
110
11.
115
120
T
mgx461
j
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
( C)
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