74aup1z04 NXP Semiconductors, 74aup1z04 Datasheet - Page 16

• Manufacturer Part Number: 74aup1z04
• Description: 74aup1z04 Low-power X-tal Driver With Enable And Internal Resistor
• Manufacturer: NXP Semiconductors

NXP Semiconductors
74AUP1Z04_1
Product data sheet
13.1.2 Testing
After the calculations are performed for a particular crystal, the oscillator circuit should be
tested. The following simple checks will verify the prototype design of a crystal controlled
oscillator circuit. Perform them after laying out the board:
As the 74AUP1Z04 isolates the system loading, once the design is optimized, the single
layout may work in multiple applications for any given crystal.
Fig 12. Crystal oscillator configuration for the 74AUP1Z04
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•
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Test the oscillator over worst-case conditions (lowest supply voltage, worst-case
crystal and highest operating temperature). Adding series and parallel resistors can
simulate a worst-case crystal.
Insure that the circuit does not oscillate without the crystal.
Check the frequency stability over a supply range greater than that which is likely to
occur during normal operation.
Check that the start-up time is within system requirements.
Rev. 01 — 12 December 2006
X1
74AUP1GU04
portion
C 2
1 M
Low-power X-tal driver with enable and internal resistor
Xtal
X2
R 1
C 1
74AUP1G04
portion
Y
system
C sys
load
001aad596
R sys
74AUP1Z04
© NXP B.V. 2006. All rights reserved.
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