lh28f016sct-zr Sharp Microelectronics of the Americas, lh28f016sct-zr Datasheet - Page 29

• Manufacturer Part Number: lh28f016sct-zr
• Description: Flash Memory 16mbit 2mbitx8
• Manufacturer: Sharp Microelectronics of the Americas

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 14. Transient Equivalent Testing
Figure 12. Transient Input/Output Reference Waveform for V
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10ns.
(2.0 V
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0". Input timing begins, and output timing ends, at 1.5V.
AC test inputs are driven at V
0.45
2.7
0.0
3.0
0.0
2.4
C
TTL
L
Capacitance
Includes Jig
Figure 11. Transient Input/Output Reference Waveform for V
) and V
Figure 13. Transient Input/Output Reference Waveform for V
Load Circuit
IL
INPUT
INPUT
INPUT
(0.8 V
1.3V
TTL
R
). Output timing ends at V
C
L
1N914
=3.3kΩ
OH
L
(2.4 V
1.35
1.5
(High Speed Testing Configuration)
(Standard Testing Configuration)
0.8
2.0
TTL
OUT
) for a Logic "1" and V
LHF16CZR
IH
and V
TEST POINTS
TEST POINTS
TEST POINTS
IL
. Input rise and fall times (10% to 90%) <10ns.
OL
(0.45 V
Test Configuration Capacitance Loading Value
V
V
V
TTL
CC
CC
CC
) for a Logic "0". Input timing begins at V
CC
Test Configuration
=3.3V±0.3V, 2.7V-3.6V
=5V±0.25V
=5V±0.5V
=3.3V±0.3V and V
CC
CC
=2.7V-3.6V
1.35
=5V±0.5V
1.5
2.0
0.8
OUTPUT
OUTPUT
CC
OUTPUT
=5V±0.25V
C
IH
L
100
50
30
(pF)
Rev. 1.2
26