e28f016xd Intel Corporation, e28f016xd Datasheet - Page 21

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e28f016xd

Manufacturer Part Number
e28f016xd
Description
16-mbit 1 Mbit X 16 Dram-interface Flash Memory
Manufacturer
Intel Corporation
Datasheet

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E
5.3 Transient Input/Output Reference Waveforms
AC test inputs are driven at V
(2.0 VTTL) and V
AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
NOTES:
1.
2. Testing characteristics for 28F016XD-95.
Testing characteristics for 28F016XD-85.
0.45
0.0
3.0
2.4
Figure 5. Transient Input/Output Reference Waveform for V
Figure 6. Transient Input/Output Reference Waveform for V
IL
(0.8 VTTL). Output timing ends at V
INPUT
INPUT
OH
(2.4 VTTL) for a Logic “1” and V
1.5
2.0
0.8
IH
and V
TEST POINTS
TEST POINTS
IL
OL
. Input rise and fall times (10% to 90%) <10 ns.
(0.45 VTTL) for a Logic “0.” Input timing begins at V
28F016XD FLASH MEMORY
CC
CC
= 5.0V ± 0.5V
= 3.3V ± 0.3V
1.5
2.0
0.8
OUTPUT
OUTPUT
(1)
(2)
IH
0533_05
0533_06
21

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