mc9s08qe4 Freescale Semiconductor, Inc, mc9s08qe4 Datasheet - Page 28

• Manufacturer Part Number: mc9s08qe4
• Description: 8-bit Hcs08 Central Processor Unit
• Manufacturer: Freescale Semiconductor, Inc

Electrical Characteristics
3.14
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
3.14.1
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale test method. The
measurement is performed with the microcontroller installed on a custom EMC evaluation board and running specialized EMC
test software designed in compliance with the test method. The conducted susceptibility is determined by injecting the transient
susceptibility signal on each pin of the microcontroller. The transient waveform and injection methodology is based on IEC
61000-4-4 (EFT/B). The transient voltage required to cause performance degradation on any pin in the tested configuration is
greater than or equal to the reported levels unless otherwise indicated by footnotes below
1
The susceptibility performance classification is described in
28
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
3
4
5
Data based on qualification test results. Not tested in production.
The program and erase currents are additional to the standard run I
with V
Typical endurance for flash was evaluated for this product family on the 9S12Dx64. For additional information on how
Freescale defines typical endurance, please refer to Engineering Bulletin EB619, Typical Endurance for Nonvolatile
Memory.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25qC using the Arrhenius equation. For additional information on how Freescale defines typical data retention,
please refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
Result
A
B
C
DD
EMC Performance
Parameter
= 3.0 V, bus frequency = 4.0 MHz.
Conducted Transient Susceptibility
Self-recovering
Soft failure
No failure
failure
Table 19. Susceptibility Performance Classification
Table 18. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
Symbol
V
CS_EFT
Subject to Change Without Notice
MC9S08QE8 Series, Rev. 3
package type
Conditions
V
T
Preliminary
DD
A
32 LQFP
= +25
Table
= 3.3 V
Performance Criteria
o
C
19.
DD
. These values are measured at room temperatures
8 MHz bus
f
OSC
8 MHz
crystal
/f
BUS
Result
Table
A
B
C
D
18.
Freescale Semiconductor
Amplitude
(Min)
>4.0
>4.0
2.3
4.0
1
Unit
kV