le57d111 Zarlink Semiconductor, le57d111 Datasheet - Page 9

• Manufacturer Part Number: le57d111
• Description: Dual Subscriber Line Interface Circuit
• Manufacturer: Zarlink Semiconductor

Logic Output
(Applies to DET1 and DET2.)
Ring-Trip Detector Input
(Applies to DAC, DB1, and DB2.)
Loop Detector
Notes:
1.
2.
3.
4.
5.
6.
SLIC Device Decoding
(For i, Channel = 1 or 2)
Unless otherwise noted, the test conditions are set up by the Le5711 device test circuit as illustrated in
a. Overload level is defined as THD = 1%.
b. Overload level is defined when THD = 1.5%.
Not tested in production. This parameter is guaranteed by characterization or correlation to other tests.
This parameter is tested at 1 kHz in production. Performance at other frequencies is guaranteed by characterization.
Group delay can be greatly reduced by using a Z
than 2 µs and increases 2WRL. The effect of group delay on linecard performance also may be compensated by synthesizing complex
impedance with the QLSLAC™ device.
Minimum current level guaranteed not to cause a false loop detect.
V
V
Bias Current
Common Mode Range
Off-hook threshold
On-hook threshold
Off-hook threshold
On-hook threshold
Hysteresis
OL
OH
, Output Low voltage
, Output High voltage
Description
Description
Description
State
0
1
2
3
Standby
Standby
Active
Active
I
I
OUT
OUT
C2
Test Conditions (See Note 1)
Test Conditions (See Note 1)
Test Conditions (See Note 1)
T
0
0
1
1
network such as that shown in
= 0.3 mA
= –0.1 mA
i
Zarlink Semiconductor Inc.
C1
0
1
1
0
9
i
Disconnect
Active
Polarity Reversed
(Le57D111 devices only)
Standby
Two-Wire Status
Figure
V
–500
BAT
Min
Min
Min
2.4
8.5
3.8
9
4
0
5. The network reduces the group delay to less
+ 1
Typ
Typ
–50
Typ
Figure 7, on page
Ring-Trip Detector
Loop Detector
Loop Detector
Loop Detector
Max
0.40
Max
Max
10.5
5.8
−2
11
DETx output
6
2
Unit
Unit
Unit
mA
nA
V
V
14.
Note
Note
Note