hcts112ms Intersil Corporation, hcts112ms Datasheet - Page 6

• Manufacturer Part Number: hcts112ms
• Description: Radiation Hardened Dual Jk Flip-flop
• Manufacturer: Intersil Corporation

NOTE:
NOTE:
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 1K
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
5, 6, 7, 9
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
5, 6, 7, 9
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
OPEN
CONFORMANCE
-
CONFORMANCE GROUPS
GROUPS
NOTE: Each pin except VCC and GND will have a resistor of 47K
1 - 4, 8, 10 - 15
GROUND
Subgroup B-5
Subgroup B-6
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS
5, 6, 7, 9
8
8
OPEN
METHOD
5005
TABLE 9. IRRADIATION TEST CONNECTIONS
1/2 VCC = 3V 0.5V
Specifications HCTS112MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample5005
5, 6, 7, 9
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
-
-
1, 7, 9
GROUND
8
5% for dynamic burn-in.
5% for static burn-in.
495
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
2, 3, 4, 10, 11, 12, 14, 15,
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
VCC = 6V
POST RAD
2, 3, 8A, 8B, 10, 11
1 - 4, 10 - 16
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
16
16
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
0.5V
VCC = 5V
1 - 4, 10 - 16
5% for irradiation testing.
PRE RAD
0.5V
1, 9
READ AND RECORD
50kHz
1, 13
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
-
-
READ AND RECORD
OSCILLATOR
Spec Number
Table 4 (Note 1)
POST RAD
25kHz
-
-
-
518603