ta1383afg TOSHIBA Semiconductor CORPORATION, ta1383afg Datasheet - Page 30
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ta1383afg
Manufacturer Part Number
ta1383afg
Description
Ntsc Chroma Decoder, Multi-point Scan Sync Processor, H/v Frequency Counter Ic For Color Tv
Manufacturer
TOSHIBA Semiconductor CORPORATION
Datasheet
1.TA1383AFG.pdf
(47 pages)
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Note No.
CH4
CH5
TOF characteristic
TOF (f0・q) control characteristic
Characteristic
SW2
SW Mode
B
B
SW30
C
C
(1)
(2)
(3)
(4)
(5)
(6)
(1)
(2)
(3)
(4)
(5)
Input sine wave C (10 mV
Set TEST (SA 03H) to 82H and TINT (SA 07H) to 30H.
Set TOF f0 (SA 05H) to 87H (f0 max) and TOF Q (SA 06H) to 87H (Q max).
Set sine wave C frequency to 3.58 MHz, measure TP26 (CW OUT) signal amplitude, and determine input gain GFC.
Set sine wave C frequency to 3.58 MHz + 500 kHz, measure TP26 (CW OUT) signal amplitude, and determine input gain
GFH.
Set sine wave C frequency to 3.58 MHz − 500 kHz, measure TP26 (CW OUT) signal amplitude, and determine input gain GFL.
Input sine wave C (f0 = 3.579545 MHz, amplitude = 10 mV
Set TEST (SA 03H) to 82H and TINT (SA 07H) to 30H.
Set TOF f0 (SA 05H) to 87H (f0 = max) and TOF Q (SA 06H) to 80H (Q min), measure CW OUT (TP26) signal amplitude, and
determine input gain GFF.
Set TOF f0 (SA 05H) to 81H (f0 = min) and TOF Q (SA 06H) to 87H (max).
Measure CW OUT (TP26) signal amplitude, and determine input gain GFQ.
TP output signal waveform
GFH
GFC
GFL
30
p-p
) to C1 IN pin.
C IN input frequency
f0 − 500 kHz
f0
f0 + 500 kHz
Test Method
p-p
) to C1 IN pin.
TA1383AFG
2005-09-05
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