DS2174 MAXIM [Maxim Integrated Products], DS2174 Datasheet

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DS2174

Manufacturer Part Number
DS2174
Description
EBERT
Manufacturer
MAXIM [Maxim Integrated Products]
Datasheet

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DS2174Q
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DS2174QN
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4
FEATURES
§ Generates and detects digital patterns for
§ Programmable polynomial length and
§ Programmable, user-defined pattern registers
§ Large 48-bit count and bit error count registers
§ Software-programmable bit error insertion
§ Fully independent transmit and receive paths
§ 8-bit parallel-control port
§ Detects polynomial test patterns in the
§ Programmable for serial, 4-bit parallel, or 8-bit
§ Serial mode clock rate is 155MHz; byte mode
§
ORDERING INFORMATION
DS2174Q
DS2174QN
DESCRIPTION
The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator,
receiver, and analyzer capable of meeting the most stringent error-performance requir ements of digital
transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and
generates and uniquely synchronizes to pseudorandom patterns of the form 2
values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.
www.maxim-ic.com
Note: Some revisions of this device may incorporate deviations from published specifications known as errata. Multiple
revisions of any device may be simultaneously available through various sales channels. For information about device errata,
click here: http://www.maxim-ic.com/errata.
analyzing and trouble-shooting digital
communications systems
feedback taps for generation of any
pseudorandom patterns up to 2
taps can be used in the feedback path
for long repetitive patterns up to 512 bytes in
length
presence of bit error rates up to 10
parallel data interfaces
is 80MHz for a net 622Mbps; OC-3
Available in 44-pin PLCC
44-Pin PLCC
44-Pin PLCC -40°C to +85°C
0°C to +70°C
32
- 1; up to 32
-2
1 of 24
PIN ASSIGNMENT
APPLICATIONS
§ Routers
§ Channel Service Units (CSUs)
§ Data Service Units (DSUs)
§ Muxes
§ Switches
§ Digital-to-Analog Converters (DACs)
§ CPE Equipment
§ Bridges
§ Smart Jack
RDAT3
RDAT4
RDAT5
RDAT6
RDAT7
GND
A0
A1
A2
A3
CS
7
8
9
10
11
12
13
14
15
16
17
DS2174
n
- 1, where n can take on
39
38
37
36
35
34
33
32
31
30
29
050202
D2
D1
D0
TDAT7
TDAT6
GND
TDAT5
TDAT4
TDAT3
TDAT2
GND
DS2174
EBERT

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DS2174 Summary of contents

Page 1

... DS2174QN 44-Pin PLCC -40°C to +85°C DESCRIPTION The DS2174 enhanced bit error rate tester (EBERT software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requir ements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2 values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets ...

Page 2

... POWER-UP SEQUENCE..............................................................................................................6 1.7 DETAILED PIN DESCRIPTION..................................................................................................8 2. PARALLEL CONTROL INTERFACE ........................................................................................10 3. CONTROL REGISTERS ...............................................................................................................11 3.1 STATUS REGISTER...................................................................................................................15 3.2 PSEUDORANDOM PATTERN REGISTERS ...........................................................................15 3.3 TEST REGISTER ........................................................................................................................17 3.4 COUNT REGISTERS ..................................................................................................................17 4. RAM ACCESS .................................................................................................................................18 4.1 INDIRECT ADDRESSING ......................................................................................................... OPERATION ............................................................................................................................ TIMING CHARACTERISTICS .............................................................................................20 6.1 PARALLEL PORT ......................................................................................................................20 6.2 DATA INTERFACE....................................................................................................................22 7. MECHANICAL DIMENSIONS ....................................................................................................24 TABLE OF CONTENTS DS2174 ...

Page 3

... Table 3-1: MODE SELECT ..................................................................................................................13 Table 3-2: ERROR BIT INSERTION...................................................................................................13 Table 3-3: PSEUDORANDOM PATTERN GENERATION...............................................................16 Table 5-1: RECOMMENDED DC OPERATING CONDITIONS.......................................................19 Table 5-2: DC CHARACTERISTICS...................................................................................................19 Table 6-1: PARALLEL PORT READ TIMING...................................................................................20 Table 6-2: PARALLEL PORT WRITE TIMING .................................................................................21 Table 6-3: TRANSMIT DATA TIMING..............................................................................................22 Table 6-4: RECEIVE DATA TIMING .................................................................................................23 LIST OF FIGURES LIST OF TABLES DS2174 ...

Page 4

... Pattern Generation Polynomial Generation The DS2174 has a tap select register that can be used as a mask to tap bits in the feedback path of the polynomial generator. It also features a seed register that can be used to preload the polynomial generator with a seed value. This is done on the rising edge Control Register 1. ...

Page 5

... Generating Errors Through Control Register 2, the user can intentionally inject a particular error rate into the transmitted data stream. Injecting errors allows users to stress communication links and to check the functionality of error monitoring equipment along the path DS2174 ...

Page 6

... Power-Up Sequence On power-up, the registers in the DS2174 are in a random state. The user must program all the internal registers to a known state before proper operation can be ensured. ...

Page 7

... Transmit Serial Data or LSB of Transmit Nibble or Byte Data Transmit Data Nibble or Byte Transmit Data Nibble or Byte Transmit Data Nibble or Byte Transmit Data Byte Transmit Data Byte Transmit Data Byte Transmit Data Byte Data I/O Data I/O Data I/O Data I/O Data I/O Data I/O Data I/O Data I DS2174 ...

Page 8

... Active-low signal. Must be low to read from the part. Signal Name: WR Signal Description: Write Strobe Signal Type: Input Active-low signal. Must be low to write to the part. Signal Name: TEST Signal Description: TEST Input Signal Type: Input (with internal 10k? pullup) Test Input. Should be left floating or held high DS2174 ...

Page 9

... TDAT4. Transmit data bit 4 in byte mode TDAT5. Transmit data bit 5 in byte mode TDAT6. Transmit data bit 6 in byte mode TDAT7. Transmit data bit 7 in byte mode Signal Name Signal Description: Data I/O Signal Type: I/O Parallel data pins DS2174 ...

Page 10

... REGISTER NAME Control Register 1 Control Register 2 Control Register 3 Control Register 4 Status Register Tap/Seed Register 0 Tap/Seed Register 1 Tap/Seed Register 2 Tap/Seed Register 3 TEST Register Count Register 0 Count Register 1 Count Register 2 Count Register 3 Count Register 4 Count Register DS2174 ...

Page 11

... Pseudorandom pattern 1 = Repetitive pattern LSB/MSB. LSB 0 = Repetitive pattern data is transmitted/received MSB first 1 = Repetitive pattern data is transmitted/received LSB first Transmit Load. A rising edge causes the transmit shift register loaded with the seed value. LPBK QRSS PS DESCRIPTION DS2174 (LSB) LSB TL ...

Page 12

... Single Bit Error Insert. A rising edge causes the device to insert a single error in SBE the outbound data. Must be cleared by the user. EIR2 Error Insert Bit 2. See Table 4. EIR1 Error Insert Bit 1. See Table 4. EIR0 Error Insert Bit 0. See Table 4. RINV SBE EIR2 DESCRIPTION DS2174 (LSB) EIR1 EIR0 ...

Page 13

... The bit that occurs after the rising edge of the SBE insert bit is inverted. In the case of the QRSS pattern, this could result in a string of 0’s longer than 14 bits; the DS2174 delays the erred bit by 1 clock cycle. Data in the nibble and byte modes is presented bits at a time. When in nibble or byte mode and ...

Page 14

... Select Bit for Registers 5h–8h. SEED 0 = Registers 5h–8h refer to tap select registers Registers 5h–8h refer to preload seed registers. PL8 Pattern Length Bit 8. Bit 8 of [8:0] End Address of Repetitive Pattern Data. PL4 PL3 PL2 DESCRIPTION R/W RAM COUNT DESCRIPTION DS2174 (LSB) PL1 PL0 (LSB) SEED PL8 ...

Page 15

... Status Register The status register contains information about the real-time status of the DS2174. When a particular event has occurred, the appropriate bit in the register is set All of the bits in this register (except for SYNC) operate in a latched fashion, which means that if an event occurs and a bit is set remains set until the user reads the register ...

Page 16

... DS2174 SEED0/1/2/3 TINV RINV ...

Page 17

... The bit counter is enabled regardless of synchronization. The status register bit BCOF is set when this 48-bit register overflows. The counter rolls over upon an overflow condition. The DS2174 latches the bit count into the bit count registers and clears the internal bit count when the LC bit in Control Register 1 is toggled from low to high ...

Page 18

... CR4.4. CR4.3 must remain set for the entire algorithm to properly increment the address pointer. START CR4.3=1 CR4.4 WRITE BYTE TO ADDRESS 0Fh LAST BYTE? YES WRITE n TO CR3 IF n > 255, THEN SET CR4.0 CR4 DONE DS2174 ...

Page 19

... TCLK = RCLK = 155MHz serial mode; outputs open-circuited or 80MHz byte mode < V < Applies to TDAT when tristated. 4) Applies to TDAT[0] and TCLKO. SYMBOL MIN TYP 3.0 3.3 DD (0°C to +70°C for DS2174Q; V -40°C to +85°C for DS2174QN; V SYMBOL MIN TYP - -500 ILP I - ...

Page 20

... RD Pulse Width DATA Output Delay After RD DATA Float Time After RD CS Hold Time After RD = Rising Edge = Falling Edge NOTES: 1) 50pF load VALID DATA (0°C to +70°C for DS2174Q; V -40°C to +85°C for DS2174QN; V SYMBOL MIN TYP t 5.0 SU(1) t 10.0 SU(2) t 10.0 H(1) t ...

Page 21

... A(3:0) Setup Time Before WR A(3:0) Hold Time After WR WR Pulse Width DATA Setup Time Before WR DATA Hold Time After WR CS Hold Time After WR t H( H(2) SU(3) VALID DATA (0°C to +70°C for DS2174Q; V ° -40°C to +85 C for DS2174QN; V SYMBOL MIN TYP t 5.0 SU(1) t 10.0 SU(2) t 10.0 H( ...

Page 22

... TDAT Output Delay After TCLKO NOTES: 1) 20pF load. 2) TDAT follows falling edge of TCLKO if CR4 rising edge if CR4 Guaranteed by design. t CYC t PWH t PWL OD(1) ° +70°C for DS2174Q; V -40°C to +85°C for DS2174QN; V SYMBOL MIN t 12.5 CYC t 5.0 PWH t 5.0 PWL t 6.45 CYC t 2.0 PWH t 2.0 ...

Page 23

... RCLK_EN Hold Time After RCLK RDAT(7:0) Setup Time Before RCLK RDAT(7:0) Hold Time After RCLK NOTES: 1) Guaranteed by design. t CYC t PWL IGNORE IGNORE IGNORE t t SU(1) H(1) ° (0°C to +70 C for DS2174Q; V -40°C to +85°C for DS2174QN; V SYMBOL MIN t 12.5 CYC t 5.0 PWH t 5.0 PWL t 6.45 CYC t 2.0 PWH t 2.0 ...

Page 24

... MECHANICAL DIMENSIONS DS2174 ...

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