STV-5410-R01 STMICROELECTRONICS [STMicroelectronics], STV-5410-R01 Datasheet - Page 96

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STV-5410-R01

Manufacturer Part Number
STV-5410-R01
Description
Mono and Colour Digital Video CMOS Image Sensors
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
VV5410 & VV6410
13.5 Image Array Blemishes
The automatic test programme rejects any sensors that contain blemishes referred to as blobs and clusters (please see below for
definitions of these terms) as they cannot be successfully defect corrected by ST coprocessor devices. Up to 120 single pixel
faults can be corrected and sensors meeting this criteria will PASS this part of the test programme.
13.5.1 Cluster Definition
A failing pixel at X with a failing pixel at position [0] or [1] or [2] or [3] or [4] or [5] or [6] or [7] or any combination of these 8
positions except the case where all positions are defective. This is a special case and is described below. In the example in
Figure 52 there are additional pixel fails in positions [3] and [7].
Blob (special case of cluster):- a failing pixel at position X with failing pixels at position [0],[1],[2],[3],[4],[5],[6] and [7] as in Figure
53 below:
96/105
Commercial in confidence
Figure 51 : Single Column Faults
cd5410-6410f-3-0.fm
Figure 52 : Cluster Example
Figure 53 : Blob Example
[X]
[X]
[X]
[X]
[0]
[6]
‘p’
‘p’
‘p’
‘p’
X
X
X
X
n
[X]
[X]
[1]
[5]
X
X
n+1
‘p’
‘p’
‘p’
X
X
X
X
p
[X]
[X]
[X]
[X]
[2]
[4]
Pixel Defect Specification

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