MBM29F080A-55 FUJITSU [Fujitsu Component Limited.], MBM29F080A-55 Datasheet - Page 25
MBM29F080A-55
Manufacturer Part Number
MBM29F080A-55
Description
8M (1M X 8) BIT
Manufacturer
FUJITSU [Fujitsu Component Limited.]
Datasheet
1.MBM29F080A-55.pdf
(47 pages)
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Note: 1. Test Conditions:
t
t
t
t
t
t
t
JEDEC Standard
AVAV
AVQV
ELQV
GLQV
EHQZ
GHQZ
AXQX
AC CHARACTERISTICS
Read Only Operations Characteristics
—
Parameter
Symbols
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Notes: 1. MBM29F080A-55: C
t
t
t
t
t
t
t
t
RC
ACC
CE
OE
DF
DF
OH
READY
2. MBM29F080A-70/-90: C
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output HIGH-Z
Output Enable to Output HIGH-Z
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
Input: 1.5 V
Output: 1.5 V
Device
Under
Test
Description
C
L
L
Figure 4
= 30 pF including jig capacitance
L
= 100 pF including jig capacitance
Test Conditions
IN3064
or Equivalent
6.2 k
Note: 2. Test Conditions:
CE = V
OE = V
OE = V
Test Setup
—
—
—
—
—
—
5.0 V
Output Load: 1 TTL gate and 100 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level
IL
MBM29F080A
IL
IL
2.7 k
Max.
Max.
Max.
Max.
Max.
Max.
Min.
Min.
Diodes = IN3064
or Equivalent
(Note1)
-55
55
55
55
30
20
20
20
0
Input: 0.8 V and 2.0 V
Output: 0.8 V and 2.0 V
(Note2)
-70
70
70
70
30
20
20
20
0
(Note2) Unit
-55/-70/-90
-90
90
90
90
40
20
20
20
0
ns
ns
ns
ns
ns
ns
ns
s
25
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