ISD-200 ETC2 [List of Unclassifed Manufacturers], ISD-200 Datasheet - Page 44

• Manufacturer Part Number: ISD-200
• Description: USB Mass Storage Class Bulk-Only Specification Compliant
• Manufacturer: ETC2 [List of Unclassifed Manufacturers]

ISD-200 ASIC Datasheet
Operational Modes
NEJECT & NCART_DET Pins
These pins are used to trigger remote-wakeup (See Table 8, 0x2F) as well as Event Notification (See
Vendor Specific ATA Commands, EVENT_NOTIFICATION). When asserted low ‘NEJECT’
indicates to ISD200 that an eject button has been pushed. When asserted low, ‘NCART_DET’ indicates
that a cartridge is present. There is an internal 1ms filter on each of these inputs.
I_MODE Pin
I_Mode pin, when asserted high, allows the ISD200 Configuration and USB Descriptor data to be retrieved
from an attached device. (See ISD-200 CONFIGURATION, DATA SOURCES)
ATA_EN Pin
ATA_EN pin allows ATA bus sharing with other host devices. De-asserting (ATA_EN=0) causes the ISD-
200 to 3-state all ATA bus interface pins to hi-Z; de-assert USB_ENUM, and reset all logic except on-
board ROM / serial ROM logic that loads configuration data. This logic remains enabled to allow
configuration data loads for the configurable external clock (CLKN) upon occurrence of chip reset.
Asserting ATA_EN (ATA_EN=1) allows normal operation. In order to insure the internal pull-up for
ATA_EN is on, TEST(3) must be tied low.
Test Mode Pins
42
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
TEST(3:0)
Normal Mode. This is the default mode of operation, or run time mode. Pull-
downs are on. CLKN is disabled.
Normal Mode. This is the default mode of operation, or run time mode. Pull-
downs are on. CLKN defaults to 32 MHz.
Normal Mode. This is the default mode of operation, or run time mode. Pull-
downs are on. CLKN defaults to 40 Mhz.
NandTree – Allows board level manufacturing tests. See following section.
Scan Mode – Fab only test mode
Limbo Setting this mode disables all output (3-state to hi-Z)
Disable Disk (Normal) - Enable USB enumeration without ATAPI interface.
Pull-downs are on.
Reserved
InTest (T) - Functional test mode with shortened timers. The DPLL and OSC
circuits are still powered with CLKN disabled. Pull-downs are off.
InTest (TM) - Functional test mode with shortened timers and shortened RAM.
The DPLL and OSC circuits are still powered with CLKN defaulting to 32 MHz.
Pull-downs are off.
InTest (TMS) - Functional test mode with shortened timers, shortened RAM,
and skip ATAPI identify boot sequence. The PLL and OSC circuits are still
powered with CLKN defaulting to 40 MHz. Pull-downs are off.
TestMux – Fab only test mode
Scan Mode – Fab only test mode
InTest (BT) – Functional test mode with DPLL bypassed (m=n=1), OSC circuits
disabled (pass through), and shortened timers. Pull-downs are off.
Reserved
In-System Design Confidential
Mode Description