ISD-200 ETC2 [List of Unclassifed Manufacturers], ISD-200 Datasheet - Page 55

• Manufacturer Part Number: ISD-200
• Description: USB Mass Storage Class Bulk-Only Specification Compliant
• Manufacturer: ETC2 [List of Unclassifed Manufacturers]

ISD-200 ASIC Datasheet
BUS_POWER=0, ATA HIGH POWER=0(byte 8, bit 4)
E^2
E^2 + Test pins
Test pins
I_MODE + Test
pins
BUS_POWER=1, ATA HIGH POWER=0(byte 8, bit 4)
E^2
E^2 + Test pins
Test pins
I_MODE + Test
pins
BUS_POWER=0, ATA HIGH POWER=1(byte 8, bit 4)
E^2
E^2 + Test pins
Test pins
I_MODE + Test
pins
BUS_POWER=1, ATA HIGH POWER=1(byte 8, bit 4)
E^2
E^2 + Test pins
Test pins
I_MODE + Test
pins
Note: All values indicate CLKN output before USB Configuration is set. When ATA HIGH POWER=1 and
BUS_POWER=1, the CLKN output will not turn on until the USB configuration is set to a non-zero value. Refer
to the “BUS_POWER=1, ATA HIGH POWER=0” section in order to tell what the CLKN output will be when the
USB Configuration is set.
For devices using CLKN that allow ATA_EN to be deasserted, it is suggested that the BUS_POWER pin is
deasserted in conjunction with ATA_EN if BUS_POWER is asserted itself.
If a device uses both test pins and E^2 or FBh to configure CLKN then it is suggested that both CLKN
values match.
If a device is to use E^2 CLKN values then the test pins must be set to either CLKN test mode in order to
get the expected value. If ATA_EN is allowed to deassert then there is the possibility that the test pin
CLKN values will be used.
102. Failure to override descriptors for slave device when BSY=0 and DRQ=1.
This issue is regarding ISD200 Configuration byte 8 bit 3. This case will usually only occur when the
device is a slave and there is a host side pull-down on DD7 and no pull-down on DD3. Is this case ISD200
will never enumerate.
Potential fixes:
1.
2.
Pull-up on DD7
Pull-down on DD7 and DD3
POR,
ATA_EN=1
EE CLKN
EE CLKN
Test CLKN
Test CLKN
EE CLKN
EE CLKN
Test CLKN
Test CLKN
12MHz -> X
EE CLKN
Test CLKN
Test CLKN
X
X
Test CLKN
Test CLKN
ATA_EN=0
EE CLKN
EE CLKN
Test CLKN
Test CLKN
X
X
X
X
X
EE CLKN
Test CLKN
Test CLKN
X
X
X
X
In-System Design Confidential
ATA_EN=1
EE CLKN
EE CLKN
Test CLKN
Test CLKN
EE CLKN
EE CLKN
Test CLKN
Test CLKN
X
EE CLKN
Test CLKN
Test CLKN
X
X
Test CLKN
Test CLKN
POR,
ATA_EN=0
X
Test CLKN
Test CLKN
FBh CLKN
X
X
X
X
X
Test CLKN
Test CLKN
FBh CLKN
X
X
X
X
ATA_EN=1
EE CLKN
Test CLKN ->
EE CLKN
Test CLKN
FBh CLKN
EE CLKN
EE CLKN
Test CLKN
FBh CLKN
EE CLKN
Test CLKN ->
EE CLKN
Test CLKN
FBh CLKN
X
X
Test CLKN
FBh CLKN
ATA_EN=0
EE CLKN
EE CLKN
Test CLKN
FBh CLKN
X
X
X
X
EE CLKN
EE CLKN
Test CLKN
FBh CLKN
X
X
X
X
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