M28W320ECB70N6E STMICROELECTRONICS [STMicroelectronics], M28W320ECB70N6E Datasheet - Page 22

• Manufacturer Part Number: M28W320ECB70N6E
• Description: 32 Mbit (2Mb x16, Boot Block) 3V Supply Flash Memory
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

M28W320ECT, M28W320ECB
DC AND AC PARAMETERS
This section summarizes the operating and mea-
surement conditions, and the DC and AC charac-
teristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are de-
rived from tests performed under the Measure-
Table 13. Operating and AC Measurement Conditions
Figure 7. AC Measurement I/O Waveform
Table 14. Capacitance
Note: Sampled only, not 100% tested.
22/53
V
V
V
Ambient Operating Temperature
Load Capacitance (C
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref.
Voltages
DD
DDQ
DD
V DDQ
Symbol
)
C
Supply Voltage
0V
C
Supply Voltage (V
OUT
IN
Parameter
Input Capacitance
Output Capacitance
L
)
DDQ
Parameter
– 40
Min
2.7
2.7
0 to V
V
DDQ
70
50
V DDQ /2
AI00610
DDQ
/2
Max
3.6
3.6
85
5
Test Condition
V
V
OUT
IN
– 40
Min
2.7
2.7
0 to V
= 0V
= 0V
V
ment Conditions summarized in Table 13,
Operating and AC Measurement Conditions. De-
signers should check that the operating conditions
in their circuit match the measurement conditions
when relying on the quoted parameters.
Figure 8. AC Measurement Load Circuit
DDQ
M28W320ECT, M28W320ECB
85
50
0.1µF
DDQ
/2
Max
V DDQ
3.6
3.6
85
5
0.1µF
V DD
– 40
Min
2.7
2.7
0 to V
V
C L includes JIG capacitance
Min
DDQ
90
50
DDQ
/2
DEVICE
Max
UNDER
3.6
3.6
85
TEST
5
1.65
– 40
Min
2.7
Max
0 to V
12
6
V
V DDQ
DDQ
10
50
C L
DDQ
25k
/2
Max
3.6
3.6
85
5
Unit
AI00609C
pF
pF
25k
Units
pF
°C
ns
V
V
V
V