MCF5212 FREESCALE [Freescale Semiconductor, Inc], MCF5212 Datasheet - Page 10

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MCF5212

Manufacturer Part Number
MCF5212
Description
Microcontroller Family Hardware Specification
Manufacturer
FREESCALE [Freescale Semiconductor, Inc]
Datasheet

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MCF5213 Family Configurations
data, and branch target addresses defining processor activity at the CPU’s clock rate. The MCF5213
includes a new debug signal, ALLPST. This signal is the logical ‘AND’ of the processor status (PST[3:0])
signals and is useful for detecting when the processor is in a halted state (PST[3:0] = 1111).
The full debug/trace interface is available only on the 100-pin packages. However, every product features
the dedicated debug serial communication channel (DSI, DSO, DSCLK) and the ALLPST signal.
1.2.3
The MCF5213 supports circuit board test strategies based on the Test Technology Committee of IEEE and
the Joint Test Action Group (JTAG). The test logic includes a test access port (TAP) consisting of a 16-state
controller, an instruction register, and three test registers (a 1-bit bypass register, a 256-bit boundary-scan
register, and a 32-bit ID register). The boundary scan register links the device’s pins into one shift register.
Test logic, implemented using static logic design, is independent of the device system logic.
The MCF5213 implementation can do the following:
1.2.4
1.2.4.1
The SRAM module provides a general-purpose 32-Kbyte memory block that the ColdFire core can access
in a single cycle. The location of the memory block can be set to any 32-Kbyte boundary within the
4-Gbyte address space. This memory is ideal for storing critical code or data structures and for use as the
system stack. Because the SRAM module is physically connected to the processor's high-speed local bus,
it can quickly service core-initiated accesses or memory-referencing commands from the debug module.
The SRAM module is also accessible by the DMA. The dual-ported nature of the SRAM makes it ideal
for implementing applications with double-buffer schemes, where the processor and a DMA device
operate in alternate regions of the SRAM to maximize system performance.
1.2.4.2
The ColdFire Flash module (CFM) is a non-volatile memory (NVM) module that connects to the
processor’s high-speed local bus. The CFM is constructed with four banks of 32K x 16-bit Flash arrays to
generate 256 Kbytes of 32-bit Flash memory. These arrays serve as electrically erasable and
programmable, non-volatile program and data memory. The Flash memory is ideal for program and data
storage for single-chip applications, allowing for field reprogramming without requiring an external high
10
Perform boundary-scan operations to test circuit board electrical continuity
Sample MCF5213 system pins during operation and transparently shift out the result in the
boundary scan register
Bypass the MCF5213 for a given circuit board test by effectively reducing the boundary-scan
register to a single bit
Disable the output drive to pins during circuit-board testing
Drive output pins to stable levels
JTAG
On-Chip Memories
SRAM
Flash
MCF5213 Microcontroller Family Hardware Specification, Rev. 1.2
Preliminary
Freescale Semiconductor

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