AM29F100B-120DGC Advanced Micro Devices, AM29F100B-120DGC Datasheet - Page 2
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AM29F100B-120DGC
Manufacturer Part Number
AM29F100B-120DGC
Description
1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only/ Boot Sector Flash Memory-Die Revision 1
Manufacturer
Advanced Micro Devices
Datasheet
1.AM29F100B-120DGC.pdf
(36 pages)
GENERAL DESCRIPTION
The Am29F100 is a 1 Mbit, 5.0 Volt-only Flash memory
organized as 131,072 bytes or 65,536 words. The
Am29F100 is offered in 44-pin SO and 48-pin TSOP
packages. Word-wide data appears on DQ0-DQ15;
byte-wide data on DQ0-DQ7. The device is designed to
be programmed in-system with the standard system
5.0 Volt V
program or erase operations. The device can also be
programmed or erased in standard EPROM program-
mers.
The standard device offers access times of 70, 90,
120, and 150 ns, allowing high-speed microproces-
sors to operate without wait states. To eliminate bus
contention the device has separate chip enable
(CE#), write enable (WE#) and output enable (OE#)
controls.
The device requires only a single 5.0 volt power sup-
ply for both read and write functions. Internally gener-
ated and regulated voltages are provided for the
program and erase operations.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Com-
mands are written to the command register using stan-
dard microprocessor write timings. Register contents
serve as input to an internal state machine that controls
the erase and programming circuitry. Write cycles also
internally latch addresses and data needed for the pro-
gramming and erase operations. Reading data out of
the device is similar to reading from other Flash or
EPROM devices.
Device programming occurs by executing the program
command sequence. This invokes the Embedded
Program algorithm—an internal algorithm that auto-
matically times the program pulse widths and verifies
proper cell margin.
Device erasure occurs by executing the erase com-
mand sequence. This invokes the Embedded Erase
algorithm—an internal algorithm that automatically pre-
programs the array (if it is not already programmed) be-
fore executing the erase operation. During erase, the
2
CC
supply. A 12.0 volt V
PP
is not required for
Am29F100
device automatically times the erase pulse widths and
verifies proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array
data or accept another command.
The Erase Suspend feature enables the system to put
erase on hold for any period of time to read data from,
or program data to, a sector that is not being erased.
The sector erase architecture allows memory sectors
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is erased
when shipped from the factory.
The hardware data protection measures include a
low V
during power transitions. The hardware sector pro-
tection feature disables both program and erase oper-
ations in any combination of the sectors of memory,
and is implemented using standard EPROM program-
mers. The temporary sector unprotect feature allows
in-system changes to protected sectors.
The hardware RESET# pin terminates any operation
in progress and resets the internal state machine to
reading array data. The RESET# pin may be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The system can place the device into the standby mode.
Power consumption is greatly reduced in this mode.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
h i g h e s t l e ve l s o f q u a l i ty, re l i a b il i ty, a n d c o s t
effectiveness. The device electrically erases all bits
within a sector simultaneously via Fowler-Nordheim
tunneling. The bytes are programmed one byte at a
time using the EPROM programming mechanism of
hot electron injection.
CC
detector automatically inhibits write operations