K4S511633C SAMSUNG [Samsung semiconductor], K4S511633C Datasheet - Page 4

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K4S511633C

Manufacturer Part Number
K4S511633C
Description
32Mx16 Mobile SDRAM 54CSP 1/CS
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
K4S511633C-YL/N/P
ABSOLUTE MAXIMUM RATINGS
Notes :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to V
Notes :
1. V
2. V
3. Any input 0V V
4. Dout is disabled, 0V
CAPACITANCE
Supply voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current
Clock
RAS, CAS, WE, CS, CKE
DQM
Address
D Q
Voltage on any pin relative to Vss
Voltage on V
Storage temperature
Power dissipation
Short circuit current
Input leakage currents include HI-Z output leakage for all bi-directional buffers with tri-state outputs.
IH
IL
0
~ DQ
(min) = -2.0V AC. The undershoot voltage duration is
(max) = 5.3V AC. The overshoot voltage duration is 3ns.
Parameter
15
Parameter
D D
supply relative to Vss
IN
Pin
(V
V
DDQ
V
DD
OUT
= 3.0V, T
.
V
DDQ.
A
= 23 C, f = 1MHz, V
Symbol
V
V
V
V
V
V
I
DDQ
D D
O H
OL
LI
I H
IL
Symbol
C
C
V
C
V
C
C
Symbol
DD
ADD
OUT
CLK
I N
IN
IN
T
Min
-0.3
, V
I
2.7
2.7
2.2
2.4
-10
, V
P
STG
OS
-
REF
D
O U T
DDQ
SS
3ns.
=0.9V
= 0V, T
A
50 mV)
Min
3.0
3.0
1.5
3.0
3.0
=Commercial, Extended and Industrial)
Typ
3.0
3.0
3.0
0
-
-
-
V
DDQ
-55 ~ +150
-1.0 ~ 4.6
-1.0 ~ 4.6
Max
Max
3.6
3.6
0.5
0.4
10
9.0
9.0
4.5
9.0
6.5
Value
-
+0.3
50
1
Unit
uA
V
V
V
V
V
V
Unit
CMOS SDRAM
pF
pF
pF
pF
pF
Rev. 1.2 Dec. 2002
I
I
O H
OL
Unit
mA
W
V
V
C
Note
= -2mA
= 2mA
Note
1
2
3

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