HCTS7266D/SAMPLE INTERSIL [Intersil Corporation], HCTS7266D/SAMPLE Datasheet - Page 4

• Manufacturer Part Number: HCTS7266D/SAMPLE
• Description: Radiation Hardened Quad 2-Input Exclusive NOR Gate
• Manufacturer: INTERSIL [Intersil Corporation]

NOTES:
NOTE:
Input Leakage Current
Noise Immunity
Functional Test
Propagation Delay
Input to Outputt
Propagation Delay
Input to Output
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500 , CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO
1. Alternate Group A in accordance with method 5005 of MIL-STD-883 may be exercised.
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
PARAMETER
CONFORMANCE GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
Subgroup B-5
Subgroup B-6
SYMBOL
4.0V is recognized as a logic “1”, and VO
TPHL
TPLH
FN
IIN
PARAMETER
VCC = 5.5V, VIN = VCC or GND
VCC = 4.5V, VIH = 2.25V,
VIL = 0.80V @ 200K RAD,
(Note 3)
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
Specifications HCTS7266MS
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
CONDITIONS
(NOTES 1, 2)
SUBGROUP
GROUP B
5
5
4
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
0.5V is recognized as a logic “0”.
GROUP A SUBGROUPS
2, 3, 8A, 8B, 10, 11
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
TEMPERATURE
3 A
+25
+25
+25
+25
o
o
o
o
C
C
C
C
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
o
C)
READ AND RECORD
MIN
2
2
Spec Number
-
-
200K RAD
LIMITS
MAX
22
29
-
5
UNITS
518627
ns
ns
-
A