P4C149 PYRAMID [Pyramid Semiconductor Corporation], P4C149 Datasheet - Page 5

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P4C149

Manufacturer Part Number
P4C149
Description
ULTRA HIGH SPEED 1K x 4 STATIC CMOS RAMS
Manufacturer
PYRAMID [Pyramid Semiconductor Corporation]
Datasheet

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AC TEST CONDITIONS
* including scope and test fixture.
Note:
Due to the ultra-high speed of the P4C148/149, care must be taken
when testing this device; an inadequate setup can cause a normal
functioning part to be rejected as faulty. Long high-inductance leads that
cause supply bounce must be avoided by bringing the V
planes directly up to the contactor fingers. A 0.01 µF high frequency
Document # SRAM104 REV B
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Level
Output Timing Reference Level
Output Load
Figure 1. Output Load
See Figures 1 and 2
GND to 3.0V
1.5V
1.5V
3ns
CC
and ground
TRUTH TABLE
capacitor is also required between V
reflections, proper termination must be used; for example, a 50
environment should be terminated into a 50 load with 1.73V (Thevenin
Voltage) at the comparator input, and a 116 resistor must be used in
series with D
Mode
Standby
Read
Write
OUT
Figure 2. Thevenin Equivalent
to match 166
CE
CE
CE
CE
CE
H
L
L
WE
WE
WE
WE
WE
X
H
L
(Thevenin Resistance).
CC
and ground. To avoid signal
Output
High Z
High Z
D
OUT
P4C148/P4C149
Page 5 of 10
Power
Standby
Active
Active
test

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