SSTUM32866EC/S,518 NXP Semiconductors, SSTUM32866EC/S,518 Datasheet - Page 20

IC BUFFER 1.8V 25BIT 96-LFBGA

SSTUM32866EC/S,518

Manufacturer Part Number
SSTUM32866EC/S,518
Description
IC BUFFER 1.8V 25BIT 96-LFBGA
Manufacturer
NXP Semiconductors
Datasheet

Specifications of SSTUM32866EC/S,518

Logic Type
1:1, 1:2 Configurable Registered Buffer with Parity
Supply Voltage
1.7 V ~ 2 V
Number Of Bits
25, 14
Operating Temperature
0°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
96-LFBGA
Logic Family
SSTU
Logical Function
Registered Buffer
Number Of Elements
1
Number Of Inputs
25
Number Of Outputs
25
High Level Output Current
-8mA
Low Level Output Current
8mA
Package Type
LFBGA
Propagation Delay Time
3ns
Operating Supply Voltage (typ)
1.8V
Operating Supply Voltage (max)
2V
Operating Supply Voltage (min)
1.7V
Clock-edge Trigger Type
Posit/Negat-Edge
Polarity
Non-Inverting
Technology
CMOS
Mounting
Surface Mount
Pin Count
96
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
935284578518
SSTUM32866EC/S-T
SSTUM32866EC/S-T

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SSTUM32866EC/S,518
Manufacturer:
NXP Semiconductors
Quantity:
10 000
NXP Semiconductors
SSTUM32866_1
Product data sheet
11.3 Error output load circuit and voltage measurement information
V
All input pulses are supplied by generators having the following characteristics:
PRR
Fig 20. Load circuit, error output measurements
Fig 21. Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to
Fig 22. Voltage waveforms, open-drain output HIGH-to-LOW transition time with respect
DD
= 1.8 V
(1) C
10 MHz; Z
RESET input.
to clock inputs
L
includes probe and jig capacitance.
0.1 V.
o
waveform 1
= 50 ; input slew rate = 1 V/ns
waveform 2
RESET
output
timing
inputs
output
Rev. 01 — 29 June 2007
LVCMOS
1.8 V DDR2-1G configurable registered buffer with parity
t
DUT
PLH
OUT
V
t
HL
0.5V
ICR
0.15 V
DD
0.5V
DD
C
L
= 10 pF
V
ICR
(1)
20 %, unless otherwise specified.
V
DD
R
test point
002aaa500
L
002aaa502
= 1 k
SSTUM32866
002aaa501
V
V
V
V
0 V
V
0 V
DD
OL
i(p-p)
DD
OH
© NXP B.V. 2007. All rights reserved.
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