SST25VF010-20-4C-SAE Microchip Technology, SST25VF010-20-4C-SAE Datasheet - Page 19
![no-image](/images/manufacturer_photos/0/4/439/microchip_technology_sml.jpg)
SST25VF010-20-4C-SAE
Manufacturer Part Number
SST25VF010-20-4C-SAE
Description
Flash 128K X 8 14 s
Manufacturer
Microchip Technology
Datasheet
1.SST25VF010-20-4C-QAE.pdf
(22 pages)
Specifications of SST25VF010-20-4C-SAE
Product Category
Flash
Rohs
yes
Memory Type
NAND Flash
Memory Size
1 Mbit
Architecture
Sectored
Interface Type
SPI
Access Time
20 ns
Supply Voltage - Max
3.6 V
Supply Voltage - Min
2.7 V
Maximum Operating Current
10 mA
Operating Temperature
+ 70 C
Mounting Style
SMD/SMT
Package / Case
SOIC-8
Organization
32 KB
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST25VF010-20-4C-SAE
Manufacturer:
SST
Quantity:
20 000
Company:
Part Number:
SST25VF010-20-4C-SAE-CT010
Manufacturer:
RENESAS
Quantity:
3 250
Company:
Part Number:
SST25VF010-20-4C-SAE-CT010
Manufacturer:
SST
Quantity:
8 000
Part Number:
SST25VF010-20-4C-SAE-T
Manufacturer:
SST
Quantity:
20 000
1 Mbit SPI Serial Flash
SST25VF010
©2006 Silicon Storage Technology, Inc.
AC test inputs are driven at V
for inputs and outputs are V
FIGURE 19: AC I
FIGURE 20: A T
V IHT
V ILT
EST
NPUT
INPUT
L
OAD
/O
HT
UTPUT
IHT
(0.7V
E
XAMPLE
(0.9V
R
1233 F20.0
DD
TO DUT
EFERENCE
DD
) and V
) for a logic “1” and V
V HT
V LT
LT
(0.3V
W
AVEFORMS
REFERENCE POINTS
DD
). Input rise and fall times (10%
19
TO TESTER
ILT
(0.1V
DD
) for a logic “0”. Measurement reference points
V HT
V LT
C
L
↔
OUTPUT
90%) are <5 ns.
Note: V
1233 F19.0
V
V
V
LT
IHT
ILT
HT
- V
- V
- V
- V
S71233-05-000
LOW
HIGH
INPUT
INPUT
Test
Test
LOW Test
Data Sheet
HIGH Test
1/06