74HC299DB,112 NXP Semiconductors, 74HC299DB,112 Datasheet - Page 16
![IC UNIV SHIFT REGISTER 20SSOP](/photos/6/52/65221/20-ssop_sot339-1_sml.jpg)
74HC299DB,112
Manufacturer Part Number
74HC299DB,112
Description
IC UNIV SHIFT REGISTER 20SSOP
Manufacturer
NXP Semiconductors
Series
74HCr
Datasheets
1.74HCT4046ADB112.pdf
(19 pages)
2.74HCT4046ADB112.pdf
(23 pages)
3.74HC299N652.pdf
(24 pages)
Specifications of 74HC299DB,112
Number Of Circuits
8-Bit
Package / Case
20-SSOP
Logic Type
Universal Shift Register, CMOS
Current - Output High, Low
6mA, 6mA
Voltage - Supply
2 V ~ 6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Counting Sequence
Serial/Parallel to Serial/Parallel
Logic Family
74HC
Propagation Delay Time
200 ns, 40 ns, 34 ns
Supply Voltage (max)
6 V
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Operating Supply Voltage
2 V to 6 V
Output Type
3-State
Function
Shift Register
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-2661-5
935189890112
935189890112
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
74HC299DB,112
Manufacturer:
MICREL
Quantity:
1 401
Philips Semiconductors
HCMOS family characteristics
FAMILY SPECIFICATIONS
AC CHARACTERISTICS
The “AC CHARACTERISTICS” table lists the guaranteed
limits when a device is tested under the conditions given in
the AC Test Circuits and Waveforms section.
TEST CIRCUITS
Good high-frequency wiring practices should be used in
test circuits. Capacitor leads should be as short as
possible to minimize ripples on the output waveform
transitions and undershoot. Generous ground metal
(preferably a ground-plane) should be used for the same
reasons. A V
decoupling capacitor should be provided
CC
at the test socket, also with short leads. Input signals
should have rise and fall times of 6 ns, a signal swing of
0 V to V
for 74HC and 0 V to 3 V for 74HCT; a 1.0 MHz
CC
square wave is recommended for most propagation delay
tests. The repetition rate must be increased for testing
f
. Two pulse generators are usually required for testing
max
such parameters as set-up time, hold time and removal
time. f
is also tested with 6 ns input rise and fall times,
max
with a 50% duty factor, but for typical f
as high as
max
60 MHz, there are no constraints on rise and fall times.
March 1988
16